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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces

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ISBN-10: 3540284052

ISBN-13: 9783540284055

Edition: 2006

Authors: Gerd Kaupp

List price: $219.99
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Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat…    
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Book details

List price: $219.99
Copyright year: 2006
Publisher: Springer Berlin / Heidelberg
Publication date: 8/4/2006
Binding: Hardcover
Pages: 292
Size: 6.10" wide x 9.25" long x 0.75" tall
Weight: 2.948

Atomic force microscopy
Scanning near-field optical microscopy