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| A Personal Foreword | |
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| Preface to the First Edition | |
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| Acknowledgment | |
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| Introduction | |
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| Motivation | |
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| Definition of Optical Pump and Probe | |
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| Guideline | |
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| Matrix of Laser Effects and Applications | |
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| Historical Survey of Optical Ultra-fast Metrology | |
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| Metrology Techniques Before the Advent of Laser | |
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| Ultra-fast Pump and Probe Metrology | |
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| Ultra-fast Engineering Working Tools | |
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| Ultra-fast Laser Sources | |
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| General Aspects for Ultra-precise Engineering | |
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| General Aspects on Ultra-fast Lasers for Ultra-fast Metrology | |
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| Laser Oscillator | |
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| Rod and Disk Solid-State Laser | |
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| Fiber Oscillator | |
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| Amplifier | |
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| Amplification Media | |
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| Chirped-Pulse Amplification (CPA) | |
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| Optical Parametric Chirped-Pulse Amplification (OPCPA) | |
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| Amplifier Designs | |
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| Commercial Systems | |
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| Facilities | |
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| Focusing of Ultra-fast Laser Radiation | |
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| Ultra-small Laser Focus | |
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| Gaussian Beam | |
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| Beam Parameters of Gaussian Radiation | |
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| Pulse Duration | |
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| Beam Stability | |
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| Key Parameters for Ultra-precision Machining and Diagnostics | |
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| Ultra-precise Machining | |
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| Ultra-fast Pump and Probe Diagnostics for Mechanical Engineering | |
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| Beam Positioning and Scanning | |
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| Positioning | |
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| Scanning Systems | |
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| New Challenges to Ultra-fast Metrology | |
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| Temporal Domain | |
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| Spatial Domain | |
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| Domains of Optical Pump and Probe Techniques for Process Diagnosis | |
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| Fundamentals of Laser Interaction | |
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| Linear to Non-linear Optics | |
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| Linear Optics: Group Velocity Dispersion and Chirp | |
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| Non-linear Processes | |
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| Non-linear Polarization | |
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| Self-focusing | |
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| Spectral Broadening by Self-phase Modulation | |
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| Catastrophic Self-focusing | |
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| High-Power Photon-Matter Interaction | |
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| Absorption of Laser Radiation in Matter | |
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| Energy Transfer from Electrons to Matter | |
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| Melting and Vaporization | |
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| Melt Dynamics | |
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| Onset of Ablation | |
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| Ionization | |
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| Matching of Plasma Dynamics on Ultra-fast Time-Scale | |
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| Absorption of Radiation in a Plasma | |
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| Electromagnetic Waves in Plasmas | |
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| Inverse Bremsstrahlung | |
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| Plasma Heating | |
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| Ionization of a Plasma | |
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| Cross-Section and Collision Frequency | |
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| Electron Transitions and Energy Transport | |
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| The Total Emission | |
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| The Opacity | |
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| Dielectric Function of a Plasma | |
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| Ponderomotive Force | |
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| Fundamentals of Pump and Probe | |
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| Ultra-fast Laser Radiation | |
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| Beam Propagation | |
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| Dispersion | |
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| Coherence | |
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| Preparation of States and Conditions for Probe Beams | |
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| Preparation of States | |
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| Preparation of States by Spectro-Temporal Shaping | |
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| Measurement of States | |
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| Measurement of Radiation Properties | |
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| Pulse Duration | |
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| Spectral Phase | |
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| Imaging with Ultra-fast Laser Radiation | |
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| Diffraction Theory and Incoherent Illumination | |
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| Image Formation by Microscopy and Coherent Illumination | |
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| Temporal Delaying | |
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| Mechanical Delay | |
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| Single-Pass Delay Stage | |
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| Multi-Pass Delay Stage | |
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| Mechanical Optoelectronic Scanning | |
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| Non-mechanical Delay | |
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| Free-Running Lasers | |
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| Synchronized Lasers | |
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| Examples for Ultra-fast Detection Methods | |
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| Non-imaging Detection | |
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| Transient Absorption Spectroscopy (TAS) | |
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| Principle and Setup | |
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| Characterization of the White-Light Continuum | |
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| Measurement by TAS | |
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| Temporal Shaped Pulses | |
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| Principle and Setup | |
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| Characterization of the Si-K<sub>�</sub>-Radiation Source | |
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| Imaging Detection | |
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| Non-coherent Methods | |
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| Shadowgraphy | |
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| Transient Quantitative Phase Microscopy (TQPm) | |
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| Coherent Methods | |
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| Mach-Zehnder Micro-Interferometry | |
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| Speckle Microscopy | |
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| Nomarsky Microscopy | |
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| Applications of Pump and Probe Metrology | |
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| Drilling of Metals | |
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| Introduction | |
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| Measurement of Ejected Plasma, Vapor and Melt | |
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| Microstructuring of Metals | |
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| Introduction | |
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| Detection of Plasma Dynamics | |
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| Marking of Glass | |
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| Introduction | |
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| Detection of Laser-Induced Defects | |
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| Detection of Refractive-Index Changes and Cracking | |
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| Welding of Technical Glasses and Silicon | |
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| Introduction | |
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| Detection of Laser-Induced Melting | |
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| Perspectives for the Future | |
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| Laser and Other Sources | |
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| Methodology | |
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| Scanning Technology | |
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| Spatial Scanning | |
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| Temporal Scanning | |
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| Beam Shaping | |
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| Spatial Shaping | |
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| Temporal Shaping | |
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| Summary | |
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| Lock-in Amplifier | |
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| Onset on Optics | |
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| Abbe Sine Condition | |
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| Quantitative Phase Microscopy | |
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| Plasma Parameters | |
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| Transport Coefficients | |
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| Electrical Conductivity | |
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| Thermal Conductivity | |
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| Diffusivity of Electrons | |
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| Viscosity | |
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| Debye Length | |
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| Plasma Oscillations and Waves | |
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| Coupling Between Electrons and Ions | |
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| Hydrodynamic Instabilities | |
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| Facilities | |
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| List of Abbreviations and Symbols | |
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| Abbreviations | |
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| Symbols | |
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| References | |
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| Glossary | |
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| Index | |