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Designer's Guide to Built-In Self-Test

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ISBN-10: 1402070500

ISBN-13: 9781402070501

Edition: 2002

Authors: Charles E. Stroud

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A recent technological advance is the art of designing circuits to test themselves, referred to as a built-in self-test (BIST). This book describes the major BIST approaches that have been proposed and implemented since 1980.
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Book details

Copyright year: 2002
Publisher: Springer
Publication date: 5/31/2002
Binding: Hardcover
Pages: 320
Size: 6.50" wide x 9.50" long x 1.00" tall
Weight: 1.540
Language: English

About the Author
An Overview of BIST
Fault Models, Detection, and Simulation
Design for Testability
Test Pattern Generation
Output Response Analysis
Manufacturing and System-Level Use of BIST
Built-In Logic Block Observer
Pseudo-Exhaustive BIST
Circular BIST
Scan-Based BIST
Non-Intrusive BIST
BIST for Regular Structures
BIST for FPGAs and CPLDs
Applying Digital BIST to Mixed-Signal Systems
Merging BIST and Concurrent Fault Detection