Designer's Guide to Built-In Self-Test

Name: Designer's Guide to Built-In Self-Test
Price: 110.12 USD
Availability: InStock
ISBN: 9781402070501

ISBN-10: 1402070500

ISBN-13: 9781402070501

Edition: 2002

Authors: Charles E. Stroud

List price: $219.99

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Description:

A recent technological advance is the art of designing circuits to test themselves, referred to as a built-in self-test (BIST). This book describes the major BIST approaches that have been proposed and implemented since 1980.

Book details

List price: $219.99
Copyright year: 2002
Publisher: Springer
Publication date: 5/31/2002
Binding: Hardcover
Pages: 320
Size: 6.10" wide x 9.25" long x 1.00" tall
Weight: 3.190
Language: English



Preface


About the Author



An Overview of BIST



Fault Models, Detection, and Simulation



Design for Testability



Test Pattern Generation



Output Response Analysis



Manufacturing and System-Level Use of BIST



Built-In Logic Block Observer



Pseudo-Exhaustive BIST



Circular BIST



Scan-Based BIST



Non-Intrusive BIST



BIST for Regular Structures



BIST for FPGAs and CPLDs



Applying Digital BIST to Mixed-Signal Systems



Merging BIST and Concurrent Fault Detection


Acronyms


Bibliography


Index