Designer's Guide to Built-In Self-Test
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A recent technological advance is the art of designing circuits to test themselves, referred to as a built-in self-test (BIST). This book describes the major BIST approaches that have been proposed and implemented since 1980.
Copyright year: 2002
Publication date: 5/31/2002
Size: 6.50" wide x 9.50" long x 1.00" tall
|About the Author|
|An Overview of BIST|
|Fault Models, Detection, and Simulation|
|Design for Testability|
|Test Pattern Generation|
|Output Response Analysis|
|Manufacturing and System-Level Use of BIST|
|Built-In Logic Block Observer|
|BIST for Regular Structures|
|BIST for FPGAs and CPLDs|
|Applying Digital BIST to Mixed-Signal Systems|
|Merging BIST and Concurrent Fault Detection|