Yield Simulation for Integrated Circuits

Name: Yield Simulation for Integrated Circuits
Price: 23.55 USD
Availability: InStock
ISBN: 9780898382440

ISBN-10: 0898382440

ISBN-13: 9780898382440

Edition: 1987

Authors: Duncan Moore, Henry Walker, D. M. Walker

List price: $169.99

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Description:

In the summer of 1981 I was asked to consider the possibility of manufacturing a 600,000 transistor microprocessor in 1985. It was clear that the technology would only be capable of manufacturing 100,000-200,000 transistor chips with acceptable yields. The control store ROM occupied approximately half of the chip area, so I considered adding spare rows and columns to increase ROM yield. Laser-programmed polysilicon fuses would be used to switch between good and bad circuits. Since only half the chip area would have redundancy, I was concerned that the increase in yield would not outweigh the increased costs of testing and redundancy programming. The fabrication technology did not yet exist,…

Book details

List price: $169.99
Copyright year: 1987
Publisher: Springer
Publication date: 9/30/1987
Binding: Hardcover
Pages: 209
Size: 6.14" wide x 9.21" long x 0.75" tall
Weight: 2.420
Language: English