Foreword | p. xi |
Acknowledgments | p. xiii |
Notes on nomenclature, acronyms and useful data | p. xv |
List of symbols | p. xvii |
Introduction | p. 1 |
Statement of the problem | p. 1 |
Design approaches | p. 2 |
A simple example | p. 4 |
Yield | p. 7 |
The role of device physics | p. 8 |
MMIC types and chip functions | p. 11 |
Scale of IC fabrication | p. 11 |
Applications | p. 12 |
Civil | p. 12 |
Military | p. 14 |
Chip functions | p. 15 |
Example MMICs | p. 17 |
Overview of passive elements | p. 29 |
Introduction | p. 29 |
Microstripline | p. 30 |
Inductors | p. 34 |
Capacitors | p. 41 |
Resistors | p. 47 |
The Lange coupler | p. 49 |
Other components | p. 50 |
Final remarks | p. 52 |
PIN and Schottky diodes | p. 55 |
Introduction | p. 55 |
Schottky diodes | p. 56 |
PIN diodes | p. 63 |
MMIC uses of PIN and Schottky diodes | p. 67 |
Elementary FET principles | p. 69 |
Introduction | p. 69 |
Review of Si JFET operation | p. 70 |
Current saturation in the GaAs MESFET | p. 77 |
Mechanism of current saturation--summary | p. 82 |
Essential enhancements | p. 83 |
Si JFET | p. 83 |
GaAs MESFET | p. 84 |
Equivalent circuit of the GaAs MESFET | p. 85 |
Concluding remarks | p. 87 |
MESFETs | p. 91 |
Introduction | p. 91 |
Brief outline of structure | p. 91 |
Equivalent circuit--physical basis | p. 95 |
Signal delay | p. 95 |
Charge storage | p. 99 |
Current modulation | p. 109 |
Transconductance delay | p. 110 |
Intrinsic equivalent circuit | p. 112 |
Configuration | p. 112 |
Voltage dependence of the space-charge layer extension, X | p. 116 |
Gate strip inductance, [script l][subscript g] | p. 121 |
Channel, or intrinsic, resistance, R[subscript i] | p. 121 |
Channel current, I[subscript CH] | p. 121 |
Intrinsic transconductance, g[subscript m0] | p. 122 |
Gate-channel capacitance, C[subscript gc] | p. 123 |
Gate-drain capacitance, C[subscript gd] | p. 123 |
Transconductance delay, [tau][subscript gm] | p. 124 |
Implications for FET design and usage | p. 124 |
Output conductance and other microwave effects of substrate current | p. 125 |
Effect of surface charge, non-uniform doping and gate recess depth | p. 135 |
Series parasitic resistances R[subscript s] and R[subscript d] and effect on equivalent circuit | p. 138 |
Source resistance, R[subscript s] | p. 139 |
Drain resistances, R[subscript D] and R[subscript d] | p. 142 |
Gate resistance | p. 145 |
Geometric capacitance | p. 146 |
Via-hole inductance | p. 155 |
GaAs FET noise | p. 156 |
Power MMICs | p. 163 |
High electron mobility transistors | p. 189 |
Introduction | p. 189 |
Energy band line-up | p. 190 |
Physical basis and structure | p. 192 |
Practical HEMT structures | p. 196 |
Principal equivalent circuit elements | p. 198 |
HEMT noise | p. 201 |
Prospects for HEMT integration | p. 202 |
Reverse modeling GaAs MESFETs and HEMTs | p. 205 |
Introduction | p. 205 |
Reverse modeling for gate length | p. 205 |
Errors in eqns (8.2) and (8.6) | p. 211 |
Extension to HEMTs | p. 211 |
General comments | p. 215 |
Reverse modeling for channel doping | p. 218 |
Conclusion | p. 219 |
Design limits | p. 221 |
Introduction | p. 221 |
Limits to small-signal behavior | p. 222 |
Gain, frequency and voltage, and gate length | p. 222 |
Effect of gatewidth, Z[subscript G] | p. 225 |
Input and output reflection coefficient | p. 232 |
Maximum Tunable Gain (MTG), MAG, MSG and MUG | p. 242 |
Limits to large-signal (power) behavior | p. 248 |
FETs in amplifiers | p. 259 |
Introduction | p. 259 |
Amplifier topologies and design principles | p. 261 |
Reactively matched amplifiers | p. 263 |
Design of a two-element matching or gain slope compensation network | p. 268 |
Lossy matched amplifiers | p. 277 |
Feedback amplifiers | p. 279 |
Distributed amplifiers | p. 287 |
The matrix amplifier | p. 300 |
Balanced amplifiers | p. 303 |
First trial device synthesis | p. 305 |
FET synthesis by reverse modeling | p. 310 |
FET synthesis for distributed power amplifiers | p. 312 |
Power-impedance considerations | p. 313 |
Frequency considerations | p. 315 |
FET synthesis--example | p. 316 |
Final remarks | p. 321 |
Computer-aided design | p. 325 |
Introduction | p. 325 |
Sensitivity analysis--basis | p. 327 |
Application of the Monte Carlo method to yield forecasting | p. 337 |
Uses of yield forecasting | p. 343 |
FET centering | p. 344 |
Longer-term developments | p. 346 |
Future developments | p. 357 |
Index | p. 365 |
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