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Characterization of High Tc Materials and Devices by Electron Microscopy

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ISBN-10: 052155490X

ISBN-13: 9780521554909

Edition: 2000

Authors: Nigel D. Browning, Stephen J. Pennycook

List price: $140.00
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Written by leading experts, this is a clear and up-to-date account of the application of electron-based microscopes to the study of high-Tc superconductors.
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Book details

List price: $140.00
Copyright year: 2000
Publisher: Cambridge University Press
Publication date: 7/6/2000
Binding: Hardcover
Pages: 406
Size: 6.69" wide x 9.61" long x 0.94" tall
Weight: 1.870

Kjell Aleklett is Professor of Physics at Uppsala University, Sweden, and leader of Global Energy Systems Group. He holds a doctorate degree from the University of Gothenburg, Sweden, and worked as a post-doctoral staff scientist, 1977-85, at the Natural Science Laboratory at Studsvik, Sweden. In 1986 he was appointed as associated professor at Uppsala University and later as full professor. In 1978-79 and again in 1983, he was invited to work with Nobel Prize winner Glenn T. Seaborg, Lawrence Berkley Laboratory, University of California, Berkeley, California, USA. His interest in the global energy situation started in 1995 when he changed his field of research from high energy physics to…    

List of contributors
High-resolution transmission electron microscopy
Holography in the transmission electron microscope
Microanalysis by scanning transmission electron microscopy
Specimen preparation for transmission electron microscopy
Low-temperature scanning electron microscopy
Scanning tunneling microscopy
Identification of new superconducting compounds by electron microscopy
Valence band electron energy loss spectroscopy (EELS) of oxide superconductors
Investigation of charge distribution in Bi2Sr2CaCu2O8 and YBa2Cu3O7
Grain boundaries in high Tc materials: transport properties and structure
The atomic structure and carrier concentration at grain boundaries in YBa2Cu3O7-d
Microstructures in superconducting YBa2Cu3O7 thin films
Investigations on the microstructure of YBa2Cu3O7 thin-film edge Josephson junctions by high-resolution electron microscopy
Controlling the structure and properties of high Tc thin-film devices