Atomic Force Microscopy

Name: Atomic Force Microscopy
Price: 209.34 USD
Availability: InStock
ISBN: 9780199570454

ISBN-10: 0199570450

ISBN-13: 9780199570454

Edition: 2010

Authors: Peter Eaton, Paul West

List price: $117.50

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Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand,and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be…

Book details

List price: $117.50
Copyright year: 2010
Publisher: Oxford University Press
Publication date: 3/25/2010
Binding: Hardcover
Pages: 288
Size: 6.85" wide x 10.08" long x 0.70" tall
Weight: 1.430
Language: English



Preface


Introduction



Background to AFM



AFM today



AFM instrumentation



Basic concepts in AFM instrumentation



The AFM stage



AFM electronics



Acquisition software



AFM cantilevers and probes



AFM instrument environment



Scanning environment



AFM modes



Topographic modes



Non-topographic modes



Surface modification



Measuring AFM images



Sample preparation for AFM



Measuring AFM images in contact mode



Measuring AFM images in oscillating modes



High-resolution imaging



Force curves



AFM image processing and analysis



Processing AFM images



Displaying AFM images



Analysing AFM images



AFM image artefacts



Probe artefacts



Scanner artefacts



Image processing artefacts



Vibration noise



Noise from other sources



Other artefacts



Applications of AFM



AFM applications in physical and materials sciences



AFM applications in nanotechnology



Biological applications of AFM



Industrial AFM applications



AFM standards



Scanner calibration and certification procedures



Third party AFM software


Bibliography


Index