Advances in Imaging and Electron Physics Advances in Electron Microscopy and Diffraction

Name: Advances in Imaging and Electron Physics Advances in Electron Microscopy and Diffraction
Availability: OutOfStock
ISBN: 9780120147656

ISBN-10: 0120147653

ISBN-13: 9780120147656

Edition: 2002

Authors: Peter W. Hawkes

List price: $275.00

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Description:

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Book details

List price: $275.00
Copyright year: 2002
Publisher: Elsevier Science & Technology
Publication date: 11/5/2002
Binding: Hardcover
Pages: 462
Size: 5.94" wide x 9.00" long x 0.75" tall
Weight: 1.672
Language: English

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.



Contributors


Preface


Future Contributions


Signposts in Electron Optics




Background



Charged-Particle Optics



Aberrations



Aberration Correction



Monochromators



Wave Optics



Image Algebra


References


Introduction to Crystallography




Introduction to Crystal Symmetry



Diffraction from a Lattice


References


Convergent Beam Electron Diffraction




Introduction



More Advanced Topics


Bibliography


References


High-Resolution Electron Microscopy




Basic Principles of Image Formation



The Electron Microscope



Interpretation of the Images



Quantitative HREM



Precision and Experimental Design



Future Developments


References


Structure Determination through Z-Contrast Microscopy




Introduction



Quantum Mechanical Aspects of Electron Microscopy



Theory of Image Formation in the STEM



Examples of Structure Determination by Z-Contrast Imaging



Practical Aspects of Z-Contrast Imaging



Future Developments



Summary


References


Electron Holography of Long-Range Electromagnetic Fields: A Tutorial




Introduction



General Considerations



The Magnetized Bar



Electrostatic Fields: A Glimpse at Charged Microtips and Reverse-Biased p-n Junctions



Conclusion


References


Electron Holography: A Powerful Tool for the Analysis of Nanostructures




Electron Interference



Electron Coherence



Electron Wave Interaction with Object



Conventional Electron Microscopy (TEM)



Electron Holography



Summary


Suggested Reading


References


Crystal Structure Determination from EM Images and Electron Diffraction Patterns




Solution of Unknown Crystal Structures by Electron Crystallography



The Two Steps of Crystal Structure Determination



The Strong Interaction between Electrons and Matter



Determination of Structure Factor Phases



Crystallographic Structure Factor Phases in EM Images



The Relation between Projected Crystal Potential and HRTEM Images



Recording and Quantification of HRTEM Images and SAED Patterns for Structure Determination



Extraction of Crystallographic Amplitudes and Phases from HRTEM Images



Determination of and Compensation for Defocus and Astigmatism



Determination of the Projected Symmetry of Crystals



Interpretation of the Projected Potential Map



Quantification of and Compensation for Crystal Thickness and Tilt



Crystal Structure Refinement



Extension of Electron Crystallography to Three Dimensions



Conclusion


References


Direct Methods and Applications to Electron Crystallography




Introduction



The Minimal Prior Information



Scaling of the Observed Intensities



The Normalized Structure Factors and Their Distributions



Two Basic Questions Arising from the Phase Problem



The Structure Invariants



A Typical Phasing Procedure



Direct Methods for Electron Diffraction Data


References


Strategies in Electron Diffraction Data Collection




Introduction



Method to Improve the Dynamic Range of Charge-Coupled Device (CCD) Cameras



ELD and QED: Two Software Packages for ED Data Processing



The Three-Dimensional Merging Procedure



The Precession Technique



Conclusion


References


Advances in Scanning Electron Microscopy




Introduction



The Classical SEM



Advances in the Design of the SEM Column



Specimen Environment and Signal Detection


References


On the Spatial Resolution and Nanoscale Feature Visibility in Scanning Electron Microscopy




Introduction



Backscattered Electron Imaging



Secondary Electron Imaging



BSE-to-SE Conversion



Conclusion


References


Nanoscale Analysis by Energy-Filtering TEM




Introduction



Elemental Mapping



Quantitative Analysis of ESI Series



Mapping of ELNES



Conclusion


References


Ionization Edges: Some Underlying Physics and Their Use in Electron Microscopy




Introduction



Elastic and Inelastic Collisions



Counting the Elastic and Inelastic Events



Transitions to the Unoccupied States



Electron-Atom Interaction



Orientation Dependence



Orders of Magnitude



Mixed Dynamic Form Factor



Examples of Applications



Images



Conclusion


Appendix


References


Index