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Preface | |
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About the Author | |
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General Concepts | |
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Types of Applications of Measurement Instrumentation | |
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Why Study Measurement Systems? | |
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Classification of Types of Measurement Applications | |
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Computer-Aided Machines and Processes | |
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Conclusion | |
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Problems | |
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Bibliography | |
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Generalized Configurations and Functional Descriptions of Measuring Instruments | |
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Functional Elements of an Instrument | |
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Active and Passive Transducers | |
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Analog and Digital Modes of Operation | |
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Null and Deflection Methods | |
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Input-Output Configuration of Instruments and Measurement Systems | |
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Methods of Correction for Interfering and Modifying Inputs | |
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Conclusion | |
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Problems | |
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Generalized Performance Characteristics of Instruments | |
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Introduction | |
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Static Characteristics and Static Calibration | |
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Meaning of Static Calibration | |
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Measured Value versus True Value | |
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Some Basic Statistics | |
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Least-Squares Calibration Curves | |
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Calibration Accuracy versus Installed Accuracy | |
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Combination of Component Errors in Overall System-Accuracy Calculations | |
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Theory Validation by Experimental Testing | |
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Effect of Measurement Error on Quality-Control Decisions in Manufacturing | |
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Static Sensitivity | |
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Computer-Aided Calibration and Measurement: Multiple Regression | |
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Linearity | |
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Threshold, Noise Floor, Resolution, Hysteresis, and Dead Space | |
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Scale Readability | |
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Span | |
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Generalized Static Stiffness and Input Impedance: Loading Effects | |
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Concluding Remarks on Static Characteristics | |
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Dynamic Characteristics | |
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Generalized Mathematical Model of Measurement System | |
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Digital Simulation Methods for Dynamic Response Analysis | |
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Operational Transfer Function | |
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Sinusoidal Transfer Function | |
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Zero-Order Instrument | |
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First-Order Instrument | |
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Step Response of First-Order Instruments | |
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Ramp Response of First-Order Instruments | |
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Frequency Response of First-Order Instruments | |
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Impulse Response of First-Order Instruments | |
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Second-Order Instrument | |
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Step Response of Second-Order Instruments | |
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Terminated-Ramp Response of Second-Order Instruments | |
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Ramp Response of Second-Order Instruments | |
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Frequency Response of Second-Order Instruments | |
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Impulse Response of Second-Order Instruments | |
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Dead-Time Elements | |
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Logarithmic Plotting of Frequency-Response Curves | |
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Response of a General Form of Instrument to a Periodic Input | |
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Response of a General Form of Instrument to a Transient Input | |
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Frequency Spectra of Amplitude-Modulated Signals | |
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Characteristics of Random Signals | |
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Requirements on Instrument Transfer Function to Ensure Accurate Measurement | |
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Sensor Selection Using Computer Simulation | |
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Numerical Correction of Dynamic Data | |
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Experimental Determination of Measurement-System Parameters | |
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Loading Effects under Dynamic Conditions | |
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Problems | |
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Bibliography | |
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Measuring Devices | |
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Motion and Dimensional Measurement | |
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Introduction | |
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Fundamental Standards | |
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Relative Displacement: Translational and Rotational | |
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Calibration | |
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Resistive Potentiometers | |
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Resistance Strain Gage | |
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Differential Transformers | |
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Synchros and Resolvers | |
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Variable-Inductance and Variable-Reluctance Pickups | |
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Eddy-Current Noncontacting Transducers | |
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Capacitance Pickups | |
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Piezoelectric Transducers | |
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Electro-Optical Devices | |
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Photographic and Electronic-Imaging Techniques | |
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Photoelastic, Brittle-Coating, and Moire Fringe Stress-Analysis Techniques | |
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Displacement-to-Pressure (Nozzle-Flapper) Transducer | |
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Digital Displacement Transducers (Translational and Rotary Encoders) | |
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Ultrasonic Transducers | |
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Relative Velocity: Translational and Rotational | |
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Calibration | |
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Velocity by Electrical Differentiation of Displacement Voltage Signals | |
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Average Velocity from Measured [Delta]x and [Delta]t | |
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Mechanical Flyball Angular-Velocity Sensor | |
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Mechanical Revolution Counters and Timers | |
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Tachometer Encoder Methods | |
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Laser-Based Methods | |
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Radar (Microwave) Speed Sensors | |
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Stroboscopic Methods | |
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Translational-Velocity Transducers (Moving-Coil and Moving-Magnet Pickups) | |
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DC Tachometer Generators for Rotary-Velocity Measurement | |
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AC Tachometer Generators for Rotary-Velocity Measurement | |
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Eddy-Current Drag-Cup Tachometer | |
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Relative-Acceleration Measurements | |
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Seismic- (Absolute-) Displacement Pickups | |
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Seismic- (Absolute-) Velocity Pickups | |
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Seismic- (Absolute-) Acceleration Pickups (Accelerometers) | |
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Deflection-Type Accelerometers | |
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Null-Balance- (Servo-) Type Accelerometers | |
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Accelerometers for Inertial Navigation | |
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Mechanical Loading of Accelerometers on the Test Object | |
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Laser Doppler Vibrometers | |
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Calibration of Vibration Pickups | |
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Jerk Pickups | |
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Pendulous (Gravity-Referenced) Angular-Displacement Sensors | |
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Gyroscopic (Absolute) Angular-Displacement and Velocity Sensors | |
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Coordinate-Measuring Machines | |
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Surface-Finish Measurement | |
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Machine Vision | |
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The Global-Positioning System (GPS) | |
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Problems | |
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Bibliography | |
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Force, Torque, and Shaft Power Measurement | |
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Standards and Calibration | |
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Basic Methods of Force Measurement | |
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Characteristics of Elastic Force Transducers | |
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Bonded-Strain-Gage Transducers | |
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Differential-Transformer Transducers | |
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Piezoelectric Transducers | |
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Variable-Reluctance/FM-Oscillator Digital Systems | |
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Loading Effects | |
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Resolution of Vector Forces and Moments into Rectangular Components | |
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Torque Measurement on Rotating Shafts | |
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Shaft Power Measurement (Dynamometers) | |
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Gyroscopic Force and Torque Measurement | |
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Vibrating-Wire Force Transducers | |
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Problems | |
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Bibliography | |
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Pressure and Sound Measurement | |
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Standards and Calibration | |
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Basic Methods of Pressure Measurement | |
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Deadweight Gages and Manometers | |
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Manometer Dynamics | |
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Elastic Transducers | |
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Vibrating-Cylinder and Other Resonant Transducers | |
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Dynamic Effects of Volumes and Connecting Tubing | |
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Liquid Systems Heavily Damped, and Slow-Acting | |
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Liquid Systems Moderately Damped, and Fast-Acting | |
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Gas Systems with Tube Volume a Small Fraction of Chamber Volume | |
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Gas Systems with Tube Volume Comparable to Chamber Volume | |
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The Infinite Line-Pressure Probe | |
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Conclusion | |
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Dynamic Testing of Pressure-Measuring Systems | |
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High-Pressure Measurement | |
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Low-Pressure (Vacuum) Measurement | |
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Diaphragm Gages | |
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McLeod Gage | |
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Knudsen Gage | |
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Momentum-Transfer (Viscosity) Gages | |
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Thermal-Conductivity Gages | |
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Ionization Gages | |
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Dual-Gage Technique | |
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Sound Measurement | |
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Sound-Level Meter | |
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Microphones | |
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Pressure Response of a Capacitor Microphone | |
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Acoustic Intensity | |
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Acoustic Emission | |
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Pressure-Signal Multiplexing Systems | |
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Special Topics | |
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Pressure Distribution | |
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Overpressure Protection for Gages and Transducers | |
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Problems | |
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Bibliography | |
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Flow Measurement | |
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Local Flow Velocity, Magnitude and Direction | |
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Flow Visualization | |
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Velocity Magnitude from Pitot-Static Tube | |
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Velocity Direction from Yaw Tube, Pivoted Vane, and Servoed Sphere | |
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Dynamic Wind-Vector Indicator | |
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Hot-Wire and Hot-Film Anemometers | |
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Hot-Film Shock-Tube Velocity Sensors | |
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Laser Doppler Anemometer | |
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Gross Volume Flow Rate | |
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Calibration and Standards | |
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Constant-Area, Variable-Pressure-Drop Meters ("Obstruction" Meters) | |
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Averaging Pitot Tubes | |
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Constant-Pressure-Drop, Variable-Area Meters (Rotameters) | |
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Turbine Meters | |
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Positive-Displacement Meters | |
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Metering Pumps | |
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Electromagnetic Flowmeters | |
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Drag-Force Flowmeters | |
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Ultrasonic Flowmeters | |
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Vortex-Shedding Flowmeters | |
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Miscellaneous Topics | |
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Gross Mass Flow Rate | |
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Volume Flowmeter Plus Density Measurement | |
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Direct Mass Flowmeters | |
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Problems | |
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Bibliography | |
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Temperature and Heat-Flux Measurement | |
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Standards and Calibration | |
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Thermal-Expansion Methods | |
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Bimetallic Thermometers | |
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Liquid-in-Glass Thermometers | |
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Pressure Thermometers | |
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Thermoelectric Sensors (Thermocouples) | |
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Common Thermocouples | |
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Reference-Junction Considerations | |
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Special Materials, Configurations, and Techniques | |
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Electrical-Resistance Sensors | |
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Conductive Sensors (Resistance Thermometers) | |
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Bulk Semiconductor Sensors (Thermistors) | |
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Junction Semiconductor Sensors | |
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Digital Thermometers | |
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Radiation Methods | |
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Radiation Fundamentals | |
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Radiation Detectors: Thermal and Photon | |
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Unchopped (DC) Broadband Radiation Thermometers | |
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Chopped (AC) Broadband Radiation Thermometers | |
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Chopped (AC) Selective-Band (Photon) Radiation Thermometers | |
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Automatic Null-Balance Radiation Thermometers | |
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Monochromatic-Brightness Radiation Thermometers (Optical Pyrometers) | |
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Two-Color Radiation Thermometers | |
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Blackbody-Tipped Fiber-Optic Radiation Thermometer | |
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Fluoroptic Temperature Measurement | |
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Infrared Imaging Systems | |
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Temperature-Measuring Problems in Flowing Fluids | |
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Conduction Error | |
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Radiation Error | |
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Velocity Effects | |
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Dynamic Response of Temperature Sensors | |
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Dynamic Compensation of Temperature Sensors | |
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Heat-Flux Sensors | |
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Slug-Type (Calorimeter) Sensors | |
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Steady-State or Asymptotic Sensors (Gardon Gage) | |
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Application Considerations | |
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Problems | |
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Bibliography | |
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Miscellaneous Measurements | |
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Time, Frequency, and Phase-Angle Measurement | |
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Liquid Level | |
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Humidity | |
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Chemical Composition | |
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Current and Power Measurement | |
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Using "Observers" to Measure Inaccessible Variables in a Physical System | |
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Sensor Fusion (Complementary Filtering) | |
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Absolute Angle Measurement | |
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Problems | |
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Bibliography | |
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Manipulation, Transmission, and Recording of Data | |
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Manipulating, Computing, and Compensating Devices | |
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Bridge Circuits | |
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Amplifiers | |
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Operational Amplifiers | |
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Instrumentation Amplifiers | |
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Transconductance and Transimpedance Amplifiers | |
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Noise Problems, Shielding, and Grounding | |
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Chopper, Chopper-Stabilized, and Carrier Amplifiers | |
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Charge Amplifiers and Impedance Converters | |
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Concluding Remarks | |
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Filters | |
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Low-Pass Filters | |
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High-Pass Filters | |
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Bandpass Filters | |
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Band-Rejection Filters | |
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Digital Filters | |
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A Hydraulic Bandpass Filter for an Oceanographic Transducer | |
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Mechanical Filters for Accelerometers | |
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Filtering by Statistical Averaging | |
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Integration and Differentiation | |
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Integration | |
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Differentiation | |
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Dynamic Compensation | |
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Positioning Systems | |
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Addition and Subtraction | |
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Multiplication and Division | |
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Function Generation and Linearization | |
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Amplitude Modulation and Demodulation | |
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Voltage-to-Frequency and Frequency-to-Voltage Converters | |
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Analog-to-Digital and Digital-to-Analog Converters; Sample/Hold Amplifiers | |
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Signal and System Analyzers (Spectrum Analyzers) | |
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Problems | |
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Bibliography | |
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Data Transmission and Instrument Connectivity | |
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Cable Transmission of Analog Voltage and Current Signals | |
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Cable Transmission of Digital Data | |
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Fiber-Optic Data Transmission | |
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Radio Telemetry | |
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Pneumatic Transmission | |
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Synchro Position Repeater Systems | |
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Slip Rings and Rotary Transformers | |
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Instrument Connectivity | |
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Data Storage with Delayed Playback (An Alternative to Data Transmission) | |
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Problems | |
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Bibliography | |
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Voltage-Indicating and -Recording Devices | |
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Standards and Calibration | |
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Analog Voltmeters and Potentiometers | |
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Digital Voltmeters and Multimeters | |
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Electromechanical Servotype XT and XY Recorders | |
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Thermal-Array Recorders and Data Acquisition Systems | |
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Analog and Digital Cathode-Ray Oscilloscopes/Displays and Liquid-Crystal Flat-Panel Displays | |
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Virtual Instruments | |
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Magnetic Tape and Disk Recorders/Reproducers | |
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Bibliography | |
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Data-Acquisition Systems for Personal Computers | |
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Essential Features of Data-Acquisition Boards | |
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The DASYLAB Data-Acquisition and -Processing Software | |
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The DASYLAB Functional Modules | |
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List and Brief Description of the Functional Modules | |
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DASYLAB Simulation Example Number One | |
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Simulating Sensor Signals and Recording Them versus Time | |
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Stopping an Experiment at a Selected Time | |
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Chart Recorder Options | |
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Producing Tables or Lists | |
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Analog and Digital Meters | |
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Some Simple Data-Processing Operations | |
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Integration and Differentiation | |
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DASYLAB Simulation Example Number Two | |
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Running the Demonstration | |
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DASYLAB Simulation Example Number Three | |
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Running the Demonstration | |
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A Simple Real-World Experiment Using DASYLAB | |
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Measurement Systems Applied to Micro- and Nanotechnology | |
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Microscale Sensors | |
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Micro-Motion-Positioning Systems | |
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Particle Instruments and Clean-Room Technology | |
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Partial-Pressure Measurements in Vacuum Processes | |
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Magnetic Levitation Systems for Wafer Conveyors | |
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Scanning-Probe Microscopes | |
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Bibliography | |
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Index | |