Transmission Electron Microscopy and Diffractometry of Materials:

Name: Transmission Electron Microscopy and Diffractometry of Materials:
Price: 126.3 USD
Availability: InStock
ISBN: 9783642297601

ISBN-10: 3642297609

ISBN-13: 9783642297601

Edition: 2012

Authors: B. Fultz, J. Howe

List price: $129.00

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Description:

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order,…

Book details

List price: $129.00
Copyright year: 2012
Publisher: Springer Verlag
Binding: Cloth Text
Pages: 820
Size: 6.50" wide x 9.50" long x 2.00" tall
Weight: 2.640
Language: English