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Boundary-Scan Handbook

ISBN-10: 1402074964

ISBN-13: 9781402074967

Edition: 3rd 2003 (Revised)

Authors: Kenneth P. Parker

List price: $249.00
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Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital systems. A fundamental benefit of the standard is its ability to transform extremely difficult printed circuit board testing problems that could only be attacked with Ad-Hoc testing methods into well-structured problems that software can easily and swiftly solve. IEEE testing standards of the 1149 family are living entities that grow and change quickly. The Boundary-Scan Handbook, Third Edition is intended to describe these standards in simple English, rather than the strict and pedantic legalese encountered in the standards. Over 180 drawings and 40 tables illustrate important concepts. Forty-six Design-for-Test rules are provided, with complete explanations. The fundamental 1149.1 standard is now over 13 years old and has a large infrastructure of support in the electronics industry. Today, a majority of custom ICs and Programmable Logic Devices have 1149.1 implementations. The Boundary-Scan Handbook, Third Edition updates the information about 1149.1, which has been revised as recently as 2001. It contains a description of the 1149.4 "Analog Boundary-Scan" standard, and gives a tutorial on analog testing technology. It then introduces the recently released IEEE 1149.6 "Advanced I/O" standard, which extends Boundary-Scan to deal with AC-coupled differential signaling now becoming common in higher performance system. Finally, since a board test system provides a suitable environment for programming non-volatile Programmable Logic Devices, the IEEE 1532 standard is described which extends the 1149.1 access protocol into the device programming domain. This forms an essential tool for testing boards and systems of the future.
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Book details

List price: $249.00
Edition: 3rd
Copyright year: 2003
Publisher: Springer
Publication date: 6/30/2003
Binding: Hardcover
Pages: 373
Size: 6.25" wide x 9.25" long x 1.00" tall
Weight: 1.782
Language: English

List of Figures
List of Tables
List of Design-for-Test Rules
Preface to the First Edition
Preface to the Second Edition
Preface to the Third Edition
Boundary-Scan Basics and Vocabulary
Digital Test Before Boundary-Scan
Edge-Connector Functional Testing
In-Circuit Testing
The Philosophy of 1149.1
Basic Architecture
The TAP Controller
The Instruction Register
Data Registers
The Boundary Register
Optimizing a Boundary Register Cell Design
Architecture Summary
Field-Programmable IC Devices
Boundary-Scan Chains
Non-Invasive Operational Modes
Pin-Permission Operational Modes
Exceptions Due to Clocking
Subordination of IEEE 1149.1
Costs and Benefits
Other Testability Standards
Boundary-Scan Description Language (BSDL)
The Scope of BSDL
Compliance Assurance
Structure of BSDL
Entity Descriptions
Generic Parameter
Logical Port Description
Standard USE Statement
Use Statements
Component Conformance Statement
Device Package Pin Mappings
Grouped Port Identification
TAP Port Identification
Compliance Enable Description
Instruction Register Description
Optional Register Description
Register Access Description
Boundary-Scan Register Description
Runbist Execution Description
Intest Execution Description
User Extensions to BSDL
Design Warnings
Some advanced BSDL Topics
Merged Cells
Asymmetrical Drivers
BSDL Description of 74BCT8374
Packages and Package Bodies
Cell Description Constants
Basic Cell Definitions BC_0 to BC_7
Cells BC_8 to BC_10 Introduced in 2001
User-Defined Boundary Cells
Definition of BSDL Extensions
Writing BSDL
Boundary-Scan Testing
Basic Boundary-Scan Testing
The 1149.1 Scanning Sequence
Basic Test Algorithm
The "Personal Tester" Versus ATE
In-Circuit Boundary-Scan
IC Test
Testing with Boundary-Scan Chains
1149.1 Chain Integrity
Interconnect Test
Connection Tests
Interaction Tests
BIST and Custom Tests
Porting Boundary-Scan Tests
Boundary-Scan Test Coverage
Advanced Boundary-Scan Topics
DC Parametric IC Tests
Sample Mode Tests
Concurrent Monitoring
Non-Scan IC Testing
Non-Digital Device Testing
Mixed Digital/Analog Testing
Multi-Chip Module Testing
Firmware Development Support
In-System Configuration
Flash Programming
Hardware Fault Insertion
Power Pin Testing
Design for Boundary-Scan Test
Integrated Circuit Level DFT
TAP Pin Placement
Power and Ground Distribution
Instruction Capture Pattern
Damage Resistant Drivers
Output Pins
Bidirectional Pins
Post-Lobotomy Behavior
User-Defined Instructions
Creation and Verification of BSDL
Board-Level DFT
Chain Configurations
TCK/TMS Distribution
Mixed Logic Families
Board Level Conflicts
Control of Critical Nodes
Power Distribution
Boundary-Scan Masters
Post-Lobotomy Board Behavior
System-Level DFT
The MultiDrop Problem
Coordination with Other Standards
Analog Measurement Basics
Analog In-Circuit Testing
Analog Failures
Measuring an Impedance
Errors and Corrections
Measurement Hardware
Limited Access Testing
Node Voltage Analysis
Testing With Node Voltages
Limited Access Node Voltage Testing
The Mixed-Signal Test Environment
IEEE 1149.4: Analog Boundary-Scan
1149.4 Vocabulary and Basics
The Target Fault Spectrum
Extended Interconnect
Digital Pins
Analog Pins
General Architecture of an 1149.4 IC
Silicon "Switches"
The Analog Test Access Port (ATAP)
The Test Bus Interface Circuit (TBIC)
The Analog Boundary Module (ABM)
The Digital Boundary Module (DBM)
The 1149.4 Instruction Set
The EXTEST Instruction
The CLAMP Instruction
The HIGHZ Instruction
The PROBE Instruction
The RUNBIST Instruction
The INTEST Instruction
Other Provisions of 1149.4
Differential ATAP Port
Differential I/O
Partitioned Internal Test Buses
Specifications and Limits
Design for 1149.4 Testability
Integrated Circuit Level
Board Level
System Level
IEEE 1149.6: Testing Advanced I/O
The Advanced I/O Problem
Traditional Inter-IC Communication
Advanced Inter-IC Communication
AC Coupled Signal Paths
Testing Advanced I/O
1149.6 Vocabulary and Basics
Advanced I/O
Signal Pin Categories
Operational Modes
Test Facilities for AC Pins
Provisions for All Signal Pins
Provisions for AC Pin Drivers
AC/DC Selection Cells
Provisions for AC Pin Receivers
The Defect Model for 1149.6
The 1149.6 Test Receiver
Test Receiver Definitions
Test Receiver DC Response
Test Receiver AC Response
Guaranteed AC-Coupling
An Integrated AC/DC Test Receiver
Initializing and Capturing Hysteretic Memory
BSDL Extensions for 1149.6
Boundary Registers Cells for 1149.6
Example 1149.6 Device and BSDL
Design for 1149.6 Testability
Integrated Circuit Level DFT
Board-Level DFT
IEEE 1532: In-System Configuration
IEEE 1532 Vocabulary and Basics
Fixed System Pins
ISC System Pins
System Modal States
System I/O Behavior
ISC Pin I/O Cell Design
Programming Features of IEEE 1532
Core 1532 Programming Instructions
Programming a Single, Simple 1532 Device
Concurrent Programming of Multiple Devices
Design for IEEE 1532 Programmability
Epilog: What Next for 1149.1, 1149.4, 1149.6 and 1532?
BSDL Syntax Specifications
Lexical elements of BSDL
Notes on syntax definition
BSDL Syntax
User Package Syntax
1149.6 Extention Attribute Syntax