Introduction to X-Ray Powder Diffractometry

ISBN-10: 0471513393

ISBN-13: 9780471513391

Edition: 1st 1996

Authors: Ron Jenkins, Robert L. Snyder

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Description:

Reflecting the recent trend towards automation, this volume focuses on the fundamentals required to understand the theory and practice of powder diffraction, with a strong emphasis on qualitative and quantitative analysis.
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Book details

List price: $202.00
Edition: 1st
Copyright year: 1996
Publisher: John Wiley & Sons, Incorporated
Publication date: 7/12/1996
Binding: Hardcover
Pages: 432
Size: 6.50" wide x 9.50" long x 1.00" tall
Weight: 1.694
Language: English

RON JENKINS teaches at the Inter-national Centre for Diffraction Data.

Characteristics of X-Radiation
The Crystalline State
Diffraction Theory
Sources for the Generation of X-Radiation
Detectors and Detection Electronics
Production of Monochromatic Radiation
Instruments for the Measurement of Powder Patterns
Alignment and Maintenance of Powder Diffractometers
Specimen Preparation
Acquisition of Diffraction Data
Reduction of Data from Automated Powder Diffractometers
Qualitative Analysis
Quantitative Analysis
Appendices
Index
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