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Preface | |
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The Importance of Interconnect Design | |
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The Basics | |
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The Past and the Future | |
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Ideal Transmission Line Fundamentals | |
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Transmission Line Structures on a PCB or MCM | |
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Wave Propagation | |
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Transmission Line Parameters | |
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Characteristic Impedance | |
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Propagation Velocity, Time, and Distance | |
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Equivalent Circuit Models for SPICE Simulation | |
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Launching Initial Wave and Transmission Line Reflections | |
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Initial Wave | |
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Multiple Reflections | |
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Effect of Rise Time on Reflections | |
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Reflections From Reactive Loads | |
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Termination Schemes to Eliminate Reflections | |
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Additional Examples | |
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Problem | |
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Goals | |
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Calculating the Cross-Sectional Geometry of the PCB | |
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Calculating the Propagation Delay | |
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Determining the Wave Shape Seen at the Receiver | |
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Creating an Equivalent Circuit | |
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Crosstalk | |
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Mutual Inductance and Mutual Capacitance | |
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Inductance and Capacitance Matrix | |
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Field Simulators | |
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Crosstalk-Induced Noise | |
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Simulating Crosstalk Using Equivalent Circuit Models | |
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Crosstalk-Induced Flight Time and Signal Integrity Variations | |
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Effect of Switching Patterns on Transmission Line Performance | |
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Simulating Traces in a Multiconductor System Using a Single-Line Equivalent Model | |
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Crosstalk Trends | |
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Termination of Odd- and Even-Mode Transmission Line Pairs | |
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Pi Termination Network | |
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T Termination Network | |
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Minimization of Crosstalk | |
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Additional Examples | |
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Problem | |
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Goals | |
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Determining the Maximum Crosstalk-Induced Impedance and Velocity Swing | |
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Determining if Crosstalk Will Induce False Triggers | |
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Nonideal Interconnect Issues | |
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Transmission Line Losses | |
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Conductor DC Losses | |
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Dielectric DC Losses | |
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Skin Effect | |
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Frequency-Dependent Dielectric Losses | |
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Variations in the Dielectric Constant | |
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Serpentine Traces | |
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Intersymbol Interference | |
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Effects of 90[deg] Bends | |
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Effect of Topology | |
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Connectors, Packages, and Vias | |
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Vias | |
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Connectors | |
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Series Inductance | |
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Shunt Capacitance | |
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Connector Crosstalk | |
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Effects of Inductively Coupled Connector Pin Fields | |
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EMI | |
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Connector Design Guidelines | |
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Chip Packages | |
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Common Types of Packages | |
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Creating a Package Model | |
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Effects of a Package | |
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Optimal Pin-Outs | |
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Nonideal Return Paths, Simultaneous Switching Noise, and Power Delivery | |
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Nonideal Current Return Paths | |
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Path of Least Inductance | |
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Signals Traversing a Ground Gap | |
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Signals That Change Reference Planes | |
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Signals Referenced to a Power or a Ground Plane | |
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Other Nonideal Return Path Scenarios | |
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Differential Signals | |
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Local Power Delivery Networks | |
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Determining the Local Decoupling Requirements for High-Speed I/O | |
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System-Level Power Delivery | |
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Choosing a Decoupling Capacitor | |
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Frequency Response of a Power Delivery System | |
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SSO/SSN | |
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Minimizing SSN | |
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Buffer Modeling | |
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Types of Models | |
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Basic CMOS Output Buffer | |
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Basic Operation | |
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Linear Modeling of the CMOS Buffer | |
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Behavioral Modeling of the Basic CMOS Buffer | |
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Output Buffers That Operate in the Saturation Region | |
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Conclusions | |
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Digital Timing Analysis | |
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Common-Clock Timing | |
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Common-Clock Timing Equations | |
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Source Synchronous Timing | |
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Source Synchronous Timing Equations | |
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Deriving Source Synchronous Timing Equations from an Eye Diagram | |
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Alternative Source Synchronous Schemes | |
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Alternative Bus Signaling Techniques | |
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Incident Clocking | |
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Embedded Clock | |
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Design Methodologies | |
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Timings | |
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Worst-Case Timing Spreadsheet | |
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Statistical Spreadsheets | |
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Timing Metrics, Signal Quality Metrics, and Test Loads | |
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Voltage Reference Uncertainty | |
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Simulation Reference Loads | |
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Flight Time | |
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Flight-Time Skew | |
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Signal Integrity | |
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Design Optimization | |
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Paper Analysis | |
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Routing Study | |
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Sensitivity Analysis | |
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Initial Trend and Significance Analysis | |
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Ordered Parameter Sweeps | |
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Phase 1 Solution Space | |
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Phase 2 Solution Space | |
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Phase 3 Solution Space | |
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Design Guidelines | |
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Extraction | |
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General Rules of Thumb to Follow When Designing a System | |
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Radiated Emissions Compliance and System Noise Minimization | |
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FCC Radiated Emission Specifications | |
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Physical Mechanisms of Radiation | |
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Differential-Mode Radiation | |
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Common-Mode Radiation | |
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Wave Impedance | |
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Decoupling and Choking | |
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High-Frequency Decoupling at the System Level | |
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Choking Cables and Localized Power and Ground Planes | |
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Low-Frequency Decoupling and Ground Isolation | |
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Additional PCB Design Criteria, Package Considerations, and Pin-Outs | |
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Placement of High-Speed Components and Traces | |
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Crosstalk | |
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Pin Assignments and Package Choice | |
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Enclosure (Chassis) Considerations | |
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Shielding Basics | |
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Apertures | |
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Resonances | |
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Spread Spectrum Clocking | |
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High-Speed Measurement Techniques | |
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Digital Oscilloscopes | |
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Bandwidth | |
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Sampling | |
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Other Effects | |
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Statistics | |
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Time-Domain Reflectometry | |
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TDR Theory | |
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Measurement Factors | |
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TDR Accuracy | |
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Launch Parasitics | |
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Probe Types | |
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Reflections | |
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Interface Transmission Loss | |
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Cable Loss | |
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Amplitude Offset Error | |
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Impedance Measurement | |
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Accurate Characterization of Impedance | |
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Measurement Region in TDR Impedance Profile | |
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Odd- and Even-Mode Impedance | |
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Crosstalk Noise | |
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Propagation Velocity | |
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Length Difference Method | |
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Y-Intercept Method | |
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TDT Method | |
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Vector Network Analyzer | |
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Introduction to S Parameters | |
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Equipment | |
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One-Port Measurements (Z[subscript o],L,C) | |
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Two-Port Measurements (T[subscript d], Attenuation, Crosstalk) | |
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Calibration | |
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Calibration for One-Port Measurements | |
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Calibration for Two-Port Measurements | |
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Calibration Verification | |
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Alternative Characteristic Impedance Formulas | |
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Microstrip | |
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Symmetric Stripline | |
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Offset Stripline | |
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GTL Current-Mode Analysis | |
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Basic GTL Operation | |
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GTL Transitions When a Middle Agent Is Driving | |
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GTL Transitions When an End Agent With a Termination Is Driving | |
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Transitions When There is a Pull-Up at the Middle Agent | |
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Frequency-Domain Components in a Digital Signal | |
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Useful S-Parameter Conversions | |
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ABCD, Z, and Y Parameters | |
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Normalizing the S Matrix to a Different Characteristic Impedance | |
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Derivation of the Formulas Used to Extract the Mutual Inductance and Capacitance from a Short Structure Using S[subscript 21] Measurements | |
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Derivation of the Formula to Extract Skin Effect Resistance from a Transmission Line | |
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Definition of the Decibel | |
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FCC Emission Limits | |
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Bibliography | |
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Index | |