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| List of Contributors | |
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| Preface | |
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| Introduction | |
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| How do we Define the Surface? | |
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| How Many Atoms in a Surface? | |
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| Information Required | |
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| Surface Sensitivity | |
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| Radiation Effects Surface Damage | |
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| Complexity of the Data | |
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| Auger Electron Spectroscopy | |
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| Introduction | |
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| Principle of the Auger Process | |
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| Instrumentation | |
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| Quantitative Analysis | |
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| Depth Profile Analysis | |
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| Summary | |
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| References | |
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| Problems | |
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| Electron Spectroscopy for Chemical Analysis | |
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| Overview | |
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| X-ray Interaction with Matter, the Photoelectron Effect and Photoemission from Solids | |
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| Binding Energy and the Chemical Shift | |
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| Inelastic Mean Free Path and Sampling Depth | |
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| Quantification | |
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| Spectral Features | |
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| Instrumentation | |
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| Spectral Quality | |
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| Depth Profiling | |
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| XY Mapping and Imaging | |
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| Chemical Derivatization | |
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| Valence Band | |
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| Perspectives | |
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| Conclusions | |
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| Acknowledgements | |
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| References | |
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| Problems | |
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| Molecular Surface Mass Spectrometry by SIMS | |
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| Introduction | |
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| Basic Concepts | |
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| Experimental Requirements | |
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| Secondary Ion Formation | |
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| Modes of Analysis | |
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| Ionization of the Sputtered Neutrals | |
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| Ambient Methods of Desorption Mass Spectrometry | |
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| References | |
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| Problems | |
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| Dynamic SIMS | |
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| Fundamentals and Attributes | |
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| Areas and Methods of Application | |
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| Quantification of Data | |
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| Novel Approaches | |
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| Instrumentation | |
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| Conclusions | |
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| References | |
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| Problems | |
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| Low-Energy Ion Scattering and Rutherford Backscattering | |
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| Introduction | |
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| Physical Basis | |
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| Rutherford Backscattering | |
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| Low-Energy Ion Scattering | |
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| Acknowledgement | |
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| References | |
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| Problems | |
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| Key Facts | |
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| Vibrational Spectroscopy from Surfaces | |
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| Introduction | |
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| Infrared Spectroscopy from Surfaces | |
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| Electron Energy Loss Spectroscopy (EELS) | |
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| The Group Theory of Surface Vibrations | |
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| Laser Raman Spectroscopy from Surfaces | |
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| Inelastic Neutron Scattering (INS) | |
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| Sum-Frequency Generation Methods | |
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| References | |
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| Problems | |
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| Surface Structure Determination by Interference Techniques | |
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| Introduction | |
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| Electron Diffraction Techniques | |
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| X-ray Techniques | |
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| Photoelectron Diffraction | |
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| References | |
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| Scanning Probe Microscopy | |
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| Introduction | |
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| Scanning Tunnelling Microscopy | |
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| Atomic Force Microscopy | |
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| Scanning Near-Field Optical Microscopy | |
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| Other Scanning Probe Microscopy Techniques | |
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| Lithography Using Probe Microscopy Methods | |
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| Conclusions | |
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| References | |
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| Problems | |
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| The Application of Multivariate Data Analysis Techniques in Surface Analysis | |
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| Introduction | |
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| Basic Concepts | |
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| Factor Analysis for Identification | |
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| Regression Methods for Quantification | |
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| Methods for Classification | |
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| Summary and Conclusion | |
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| Acknowledgements | |
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| References | |
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| Problems | |
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| Vacuum Technology for Applied Surface Science | |
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| Introduction: Gases and Vapours | |
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| The Pressure Regions of Vacuum Technology and their Characteristics | |
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| Production of a Vacuum | |
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| Measurement of Low Pressures | |
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| Acknowledgement | |
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| References | |
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| Units, Fundamental Physical Constants and Conversions | |
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| Base Units of the SI | |
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| Fundamental Physical Constants | |
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| Other Units and Conversions to SI | |
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| References | |
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| Index | |