Understanding Semiconductor Devices

ISBN-10: 019513186X

ISBN-13: 9780195131864

Edition: 2000

Authors: Sima Dimitrijev

List price: $199.95
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Ideal for undergraduate and beginning graduate students in electrical engineering, Understanding Semiconductor Devices provides a solid grounding in both fundamental principles and practical skills. The text features intuitive explanations and a motivating "electronics-to-physics" approach that progresses from basic to more abstract concepts. It includes intriguing and diverse problems, review questions, and worked out examples. DT Part I: The Fundamentals introduces students to essential material (semiconductor theory, diodes, MOSFETs, and BJTs) without assuming extensive prerequisite knowledge. DT Part II: Advanced Topics covers the specifics of deep submicron MOSFET, photonic, microwave, and power devices and introduces advanced technologies, device reliability, and quantum mechanics. Bridging the gap between theory and practice, Understanding Semiconductor Devices incorporates the "nuts and bolts" of SPICE (models and parameters) and provides links between theoretical principles and real-life issues like reliability and device parameter measurement.
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Book details

List price: $199.95
Copyright year: 2000
Publisher: Oxford University Press, Incorporated
Publication date: 2/24/2000
Binding: Hardcover
Pages: 592
Size: 8.00" wide x 10.00" long x 1.50" tall
Weight: 2.530
Language: English

The Fundamentals
Resistors: Introduction to Semiconductors
The Basics: Resistor Structure and Drift Current
Insight Into Conducitivity Ingredients: Chemical-Bond Model
Making a Semiconductor Resistor: Lithography and Diffusion
Carrier Mobility
Energy-Band Model
Capacitors: Reverse-Biased P-N Junction and MOS Structure
Basic Applications
Reverse-Biased P-N Junction
C-V Dependence of the Reverse-Biased P-N Junction: Solving the Poisson Equation
SPICE Parameters and Their Measurement
Metal Oxide Semiconductor (MOS) Capacitor and Thermal Oxide
Diodes: Forward-Biased P-N Junction and Metal-Semiconductor Contact
Rectifying Diodes: Fundamental Effects and Models
SPICE Models and Parameters, Stored-Charge Capacitance, and Temperature Effects
Reference Diodes: Breakdown Phenomena
Schottky Diodes: Metal-Semiconductor Contact
Basics of Transistor Applications
Analog Circuits
Digital Circuits
Mosfet Principles
Mosfet Technologies
Mosfet Modeling
Spice Parameters and Parasitic Elements
BJT Principles
Bipolar IC Technologies
BJT Modeling
SPICE Parameters
Parasitic Elements Not Included in Device Models
Advanced Topics
Advanced and Specific IC Devices and Technologies
Deep Submicron Mosfet
Memory Devices
Silicon-on-Insulator (SOI) Technology
BICMOS Technology
Photonic Devices
Light-Emitting Diodes (LED): Carrier Recombination
Photodetectors and Solar Cells: External Carrier Generation
Microwave FETs and Diodes
Gallium-Arsenide versus Silicon
Negative Resistance Diodes
Power Devices
Power Devices in Switch-Mode Power Circuits
Power Diodes
Semiconductor Device Reliability
Basic Reliability Concepts
Failure Mechanisms
Reliability Screening
Reliability Measurement
Quantum Mechanics
Wave Function
Heisenberg Uncertainty Principle
Schrodinger Equation
Basic Integrated Circuit Concepts and Economics
Crystal Lattices, Planes, and Directions
Hall Effect and Summary of Kinetic Phenomena
Summary of Equations and Key Points
Contents of Computer Exercises Manual
List of Selected Symbols
Answers to Selected Problems
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