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| Preface | |
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| The Fundamentals | |
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| Resistors: Introduction to Semiconductors | |
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| The Basics: Resistor Structure and Drift Current | |
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| Insight Into Conducitivity Ingredients: Chemical-Bond Model | |
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| Making a Semiconductor Resistor: Lithography and Diffusion | |
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| Carrier Mobility | |
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| Energy-Band Model | |
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| Capacitors: Reverse-Biased P-N Junction and MOS Structure | |
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| Basic Applications | |
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| Reverse-Biased P-N Junction | |
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| C-V Dependence of the Reverse-Biased P-N Junction: Solving the Poisson Equation | |
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| SPICE Parameters and Their Measurement | |
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| Metal Oxide Semiconductor (MOS) Capacitor and Thermal Oxide | |
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| Diodes: Forward-Biased P-N Junction and Metal-Semiconductor Contact | |
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| Rectifying Diodes: Fundamental Effects and Models | |
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| SPICE Models and Parameters, Stored-Charge Capacitance, and Temperature Effects | |
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| Reference Diodes: Breakdown Phenomena | |
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| Schottky Diodes: Metal-Semiconductor Contact | |
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| Basics of Transistor Applications | |
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| Analog Circuits | |
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| Digital Circuits | |
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| Mosfet | |
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| Mosfet Principles | |
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| Mosfet Technologies | |
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| Mosfet Modeling | |
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| Spice Parameters and Parasitic Elements | |
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| BJT | |
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| BJT Principles | |
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| Bipolar IC Technologies | |
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| BJT Modeling | |
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| SPICE Parameters | |
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| Parasitic Elements Not Included in Device Models | |
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| Advanced Topics | |
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| Advanced and Specific IC Devices and Technologies | |
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| Deep Submicron Mosfet | |
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| Memory Devices | |
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| Silicon-on-Insulator (SOI) Technology | |
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| BICMOS Technology | |
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| Photonic Devices | |
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| Light-Emitting Diodes (LED): Carrier Recombination | |
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| Photodetectors and Solar Cells: External Carrier Generation | |
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| Lasers | |
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| Microwave FETs and Diodes | |
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| Gallium-Arsenide versus Silicon | |
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| Jfet | |
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| Mesfet | |
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| Hemt | |
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| Negative Resistance Diodes | |
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| Power Devices | |
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| Power Devices in Switch-Mode Power Circuits | |
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| Power Diodes | |
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| Power MOSFET | |
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| IGBT | |
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| Thyristor | |
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| Semiconductor Device Reliability | |
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| Basic Reliability Concepts | |
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| Failure Mechanisms | |
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| Reliability Screening | |
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| Reliability Measurement | |
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| Quantum Mechanics | |
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| Wave Function | |
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| Heisenberg Uncertainty Principle | |
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| Schrodinger Equation | |
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| Appendices | |
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| Basic Integrated Circuit Concepts and Economics | |
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| Crystal Lattices, Planes, and Directions | |
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| Hall Effect and Summary of Kinetic Phenomena | |
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| Summary of Equations and Key Points | |
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| Contents of Computer Exercises Manual | |
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| List of Selected Symbols | |
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| Bibliography | |
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| Answers to Selected Problems | |
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| Index | |