Metrology and Fundamental Constants

Name: Metrology and Fundamental Constants
Availability: OutOfStock
ISBN: 9781586037840

ISBN-10: 1586037846

ISBN-13: 9781586037840

Edition: 2007

Authors: T. W. Hï¿½nsch, Societï¿½ italiana di fisica Staff, A. J. Wallard

List price: $254.00

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Book details

List price: $254.00
Copyright year: 2007
Publisher: IOS Press, Incorporated
Publication date: 1/1/2007
Binding: Hardcover
Pages: 649
Size: 6.75" wide x 9.50" long x 1.00" tall
Weight: 3.080
Language: English



Metrology and society



The evolution of metrology: Past times to the present day



The organization of metrology



Measurements and discoveries: The role of instruments



History of standard definitions: An outline



Physical quantities



Recent developments in uncertainty evaluation



Electrical metrology



The application of the Josephson and quantum Hall effects in electrical metrology



Single charge transport standards and quantum-metrological triangle experiments



Cooling, trapping and manipulation of atoms and Bose-Einstein condensates: Applications to metrology



Metrology with cold atoms



Atomic frequency standards, properties and applications



Frequency combs applications and optical frequency standards



Time scales and relativity



Temperature metrology: Low and ultra-low temperatures



High-temperature metrology and prospects for a new definition of the kelvin



Metrological applications of acoustic and microwave resonators



Mass metrology: Underlying assumptions, present best practice, new frontiers



Redefinition of the kilogram based on a fundamental constant



Towards an atomic realization of the kilogram: The measurements of N[subscript A] and N[subscript A]h



Metrology to support the development of nanotechnology



Metrology for chemical measurements in the environment



Developments in optical radiometry



Classical and quantum techniques for photon metrology