Characterization Methods for Submicron MOSFETs

Name: Characterization Methods for Submicron MOSFETs
Price: 169.17 USD
Availability: InStock
ISBN: 9781461285847

ISBN-10: 1461285844

ISBN-13: 9781461285847

Edition: 1995

Authors: Hisham Haddara

List price: $169.99

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Description:

The Metal-Oxide Semiconductor Field-Effect Transistor (MOSFET) is a key component in modern microelectronics. During the last decade, device physicists, researchers and engineers have been continuously faced with new elements making the task of MOSFET characterization increasingly crucial, as well as more difficult. The progressive miniaturization of devices has caused several phenomena to emerge and modify the performance of scaled-down MOSFETs. Localized degradation induced by hot carrier injection and Random Telegraph Signal (RTS) noise generated by individual traps are examples. It was thus unavoidable to develop new models and new characterization methods, or at least adapt the…

Book details

List price: $169.99
Copyright year: 1995
Publisher: Springer
Publication date: 9/26/2011
Binding: Paperback
Pages: 232
Size: 6.10" wide x 9.25" long x 0.21" tall
Weight: 0.858
Language: English