Thin Film Materials Stress, Defect Formation and Surface Evolution

Name: Thin Film Materials Stress, Defect Formation and Surface Evolution
Price: 71.57 USD
Availability: InStock
ISBN: 9780521529778

ISBN-10: 0521529778

ISBN-13: 9780521529778

Edition: 2009

Authors: L. B. Freund, Subra Suresh, Ben Freund, S. Suresh

List price: $81.99

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Description:

Thin films play an important role in many technological applications including microelectronic devices, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described wherever appropriate. While the book develops a comprehensive scientific basis with which stress, deformation and failure in thin film materials can be characterized, an attempt is also made to link the scientific…

Book details

List price: $81.99
Copyright year: 2009
Publisher: Cambridge University Press
Publication date: 12/11/2008
Binding: Paperback
Pages: 770
Size: 6.69" wide x 9.61" long x 1.54" tall
Weight: 3.278
Language: English




Introduction and overview



Film stress and substrate curvature



Stress in anisotropic and patterned films



Delamination and fracture



Film buckling, bulging and peeling



Dislocation formation in epitaxial systems



Dislocation interactions and strain relaxation



Equilibrium and stability of surfaces



The role of stress in mass transport