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| Contributors | |
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| Preface | |
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| Overview | |
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| Introduction | |
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| Laboratory [mu]-XRF | |
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| Synchrotron [mu]-XRF | |
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| References | |
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| Interaction of X-Rays with Matter | |
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| Introduction | |
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| Relevant aspects of photon interactions with matter | |
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| Single-process kernels | |
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| Representation of polarized radiation with Stokes parameters | |
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| Photoelectric effect | |
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| Rayleigh scattering | |
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| Compton scattering | |
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| Mathematical description of photon diffusion | |
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| Scalar transport equation | |
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| Vector transport equation | |
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| Differences and similarities between the scalar and vector models | |
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| Interpretation of X-ray fluorescence spectra | |
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| Advantages and limitations of the transport model for describing X-ray diffusion | |
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| Example | |
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| References | |
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| Microfocusing X-Ray Optics | |
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| Introduction | |
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| Basic imaging and non-imaging optics | |
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| Collimators and focusing systems | |
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| Early focusing systems | |
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| Kirkpatrick-Baez optics | |
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| Modern focusing systems | |
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| Imaging versus non-imaging systems | |
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| X-ray optics, aberration and astigmatism | |
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| Optical theory of X-rays | |
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| Fresnel formula | |
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| Total reflection | |
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| Geometrical aberrations | |
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| Flux, brightness and brilliance | |
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| Mirror optics | |
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| Multilayer optics | |
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| Grazing incidence mirrors | |
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| Compound systems | |
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| Capillary optics | |
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| Historical background | |
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| Monocapillary shapes and dimensions | |
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| Propagation of X-rays inside a capillary | |
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| Ray-tracing--experimental results | |
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| Capillary optics in practice | |
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| Polycapillary (Kumakhov) lenses | |
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| Refractive optics | |
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| Fresnel and Bragg-Fresnel optics | |
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| Fresnel zoneplates | |
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| Bragg-Fresnel optics | |
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| Conclusions | |
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| References | |
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| Instrumentation for [mu]-XRF with Laboratory Sources | |
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| Historical perspective | |
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| Basic components | |
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| X-ray tube intensity and brilliance | |
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| Focusing devices | |
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| Sample positioning and monitoring | |
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| Detection system and signal processing | |
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| Scanning procedure | |
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| Visualization and image processing | |
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| Sensitivity | |
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| Flat (rectangular) beam technology | |
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| Converting existing XRF equipment to [mu]-XRF application | |
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| Commercial instrumentation | |
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| High-flux instrumentation | |
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| References | |
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| Instrumentation for [mu]-XRF at Synchrotron Sources | |
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| Introduction | |
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| Synchrotron radiation sources | |
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| General properties of synchrotron radiation | |
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| Synchrotron radiation from bending magnets | |
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| Insertion devices | |
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| Storage ring and phase-space electron ellipse | |
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| Micro-XRF instrumentation at a synchrotron radiation facility | |
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| Fundamental aspects of SR-excited X-ray fluorescence analysis | |
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| Beamline layout for an X-ray microbeam facility | |
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| SR techniques for material characterization | |
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| X-ray absorption fine structure analysis | |
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| X-ray microdiffraction | |
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| Microtomography | |
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| References | |
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| Evaluation and Calibration of [mu]XRF Data | |
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| Introduction | |
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| Spectrum evaluation | |
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| Image processing and interpretation | |
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| Color encoding | |
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| Segmentation of multivariate data sets | |
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| Quantitative analysis | |
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| General considerations | |
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| Fundamental parameter method | |
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| Information depth | |
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| Self-absorption correction in heterogeneous samples | |
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| Conditions for local homogeneity - factors determining lateral resolution | |
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| Prediction of the spectral response of [mu]-XRF spectrometers | |
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| Analytical model for [mu]-XRF analysis of individual particles | |
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| Detection of systematic variations in [mu]-XRF data due to topological effects | |
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| XRF tomography | |
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| References | |
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| Comparison With Other Microanalytical Techniques | |
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| Introduction | |
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| Microscopic X-ray emission techniques | |
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| Beam penetration and flux density | |
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| Detection limits | |
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| Analysis of microscopic particles | |
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| Combination with other modes of analysis | |
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| Imaging, lateral resolution and depth resolution | |
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| Sensitivity | |
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| Accuracy and precision | |
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| Meteorites | |
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| Synthetic glasses and melt inclusions | |
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| REE analysis in standard glasses | |
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| Analysis of REE and related elements in fossils | |
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| Beam-induced damage | |
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| Laboratory [mu]-XRF | |
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| Analysis of glass fragments | |
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| Conclusions | |
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| References | |
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| Applications in the Geological Sciences | |
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| Introduction | |
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| Synchrotron radiation experimental beam lines | |
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| Synchrotron radiation induced X-ray fluorescence (SRXRF) | |
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| Extraterrestrial materials | |
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| Fluid inclusions | |
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| Ore formation | |
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| Determination of metals in sediments and in pore water | |
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| Detection of rare earth elements | |
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| Trace elements in minerals | |
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| X-ray diffraction | |
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| High-pressure experiments | |
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| Computed tomography experiments | |
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| XANES and EXAFS | |
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| Summary | |
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| Acknowledgments | |
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| References | |
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| Applications in Art and Archaeology | |
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| Introduction | |
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| Trace element fingerprinting | |
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| Trace analysis of historic glass | |
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| Analysis of inks | |
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| Microscopic analysis | |
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| Glass corrosion | |
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| Inclusions in iron artefacts | |
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| Local analysis of macroscopic objects | |
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| Enamel decorations | |
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| Coins and statues | |
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| Ink on handwritten documents | |
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| Towards in-situ [mu]-XRF investigations | |
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| Laboratory-built equipment | |
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| Commercial equipment | |
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| Compact focusing optics | |
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| Conclusions | |
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| References | |
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| Environmental and Biological Applications of [mu]-XRF | |
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| Industrial Applications of [mu]-XRF | |
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| Single-particle analysis | |
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| Atmospheric particles | |
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| Single aerosol particle analysis | |
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| Analysis of fly-ash | |
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| Trace element analysis of individual particles | |
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| Elemental imaging of single particles | |
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| Elemental mapping of particles deposited on plant surfaces | |
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| Chemical state of specific elements in single particles | |
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| Combined microfluorescence and microdiffraction analysis | |
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| Analysis of tree rings and wood tissues | |
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| Trace element composition of tree rings | |
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| Trace element analysis of single fibres in wood tissues | |
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| Density variations between and within individual rings | |
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| Other environmentally oriented biological applications | |
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| References | |
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| Industrial Applications of [mu]-XRF | |
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| Introduction | |
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| Plating and film thickness | |
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| Waste characterization | |
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| Electronic components | |
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| Development of new disposal methods | |
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| Forensics | |
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| Hair analysis | |
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| Particle analysis | |
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| Homogeneity of steel alloying elements | |
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| Materials analysis in the industrial laboratory | |
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| Analysis of metal pins | |
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| Analysis of spray nozzle | |
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| Analysis of amalgamated metal powders | |
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| Analysis of automobile catalyst | |
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| Characterization of moved oxide fuel surrogate feed material | |
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| Materials science applications using synchrotron radiation | |
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| Conclusions | |
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| Acknowledgments | |
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| References | |
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| The Future of [mu]-XRF | |
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| Introduction | |
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| Laboratory [mu]-XRF | |
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| Synchrotron radiation based [mu]-XRF | |
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| Detection and spectrometry of X-rays | |
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| Analytical characteristics | |
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| Quantitative analysis | |
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| Prospects | |
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| Laboratory [mu]-XRF | |
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| Synchrotron radiation [mu]-XRF | |
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| Summary | |
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| References | |
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| Index | |