Matching Properties of Deep Sub-Micron MOS Transistors

Name: Matching Properties of Deep Sub-Micron MOS Transistors
Price: 169.17 USD
Availability: InStock
ISBN: 9780387243146

ISBN-10: 0387243143

ISBN-13: 9780387243146

Edition: 2005

Authors: Jeroen A. Croon, Willy Sansen, Herman E. Maes

List price: $169.99

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Description:

Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermore, due to the down-scaling of device dimensions, transistor mismatch has an increasing impact on digital circuits. The matching properties of MOSFETs are studied at several levels of abstraction: A simple and physics-based model is presented that accurately describes the mismatch in the drain current. The model is illustrated by dimensioning the unit current cell of a current-steering D/A…

Book details

List price: $169.99
Copyright year: 2005
Publisher: Springer
Publication date: 3/24/2005
Binding: Hardcover
Pages: 206
Size: 6.14" wide x 9.13" long x 0.75" tall
Weight: 2.376
Language: English



Introduction: Matching analysis


Importance for circuit design


State of the art


Research objectives


Outline of this book


Measurement and Modeling of Mismatch


Measurement setup


Experimental setup


Modeling of mismatch in the drain current


Width and length dependence


Example: Yield of a current-steering D/A converter


Conclusions


Parameter Extraction


Extraction methods


Experimental setup


Comparison of extraction methods


Future issues


Conclusions


Physical Origins of Mosfet Mismatch


Basic operation of the MOS transistor


Mismatch in the drain current


Physical origins of fluctuations


Conclusions


Technological Aspects


Technology descriptions


Impact of the gate


Impact of the halo implantation


Comparison of diï¿½“erent CMOS technologies


Alternative device concepts


Conclusions


Impact of Line-Edge Roughness


Characterization of line-edge roughness


Modeling the impact of line-width roughness


Experimental investigation of the impact of LWR


Prediction of the impact of LWR and guidelines


Conclusions


Conclusions, Future Work and Outlook


Conclusions


Future work


Outlook