x

Our Privacy Policy has changed. By using this site, you agree to the Privacy Policy.

Scanning Electron Microscopy and X-Ray Microanalysis

ISBN-10: 0306472929
ISBN-13: 9780306472923
Edition: 3rd 2003 (Revised)
List price: $99.00 Buy it from $77.30
This item qualifies for FREE shipping

*A minimum purchase of $35 is required. Shipping is provided via FedEx SmartPost® and FedEx Express Saver®. Average delivery time is 1 – 5 business days, but is not guaranteed in that timeframe. Also allow 1 - 2 days for processing. Free shipping is eligible only in the continental United States and excludes Hawaii, Alaska and Puerto Rico. FedEx service marks used by permission."Marketplace" orders are not eligible for free or discounted shipping.

30 day, 100% satisfaction guarantee

If an item you ordered from TextbookRush does not meet your expectations due to an error on our part, simply fill out a return request and then return it by mail within 30 days of ordering it for a full refund of item cost.

Learn more about our returns policy

Description: Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this text emphasises practical aspects of imaging and analysis for a broad audience of students and practitioners  More...

New Starting from $101.66
what's this?
Rush Rewards U
Members Receive:
coins
coins
You have reached 400 XP and carrot coins. That is the daily max!
You could win $10,000

Get an entry for every item you buy, rent, or sell.

Study Briefs

Limited time offer: Get the first one free! (?)

All the information you need in one place! Each Study Brief is a summary of one specific subject; facts, figures, and explanations to help you learn faster.

Add to cart
Study Briefs
Periodic Table Online content $4.95 $1.99
Add to cart
Study Briefs
SQL Online content $4.95 $1.99
Add to cart
Study Briefs
MS Excel® 2010 Online content $4.95 $1.99
Add to cart
Study Briefs
MS Word® 2010 Online content $4.95 $1.99

Customers also bought

Loading
Loading
Loading
Loading
Loading
Loading
Loading
Loading
Loading
Loading

Book details

List price: $99.00
Edition: 3rd
Copyright year: 2003
Publisher: Springer
Publication date: 4/30/2007
Binding: Mixed Media
Pages: 690
Size: 7.50" wide x 10.50" long x 2.00" tall
Weight: 3.872
Language: English

Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this text emphasises practical aspects of imaging and analysis for a broad audience of students and practitioners whose backgrounds span a wide range of science and technology.

Jack Kornfield trained as a Buddhist monk in the monasteries of Thailand, India, and Burma. He is a founding teacher of the Insight Meditation Society in Barre, Massachusetts, and Spirit Rock Meditation Center in Woodacre, California, and has taught meditation internationally since 1974. His books include After the Ecstasy, the Laundry and The Art of Forgiveness, Lovingkindness, and Peace.

Patrick Echlin was a lecturer in the Department of Plant Sciences and Director of the Multi-Imaging Centre, School of Biological Science, University of Cambridge until he retired in 1999. He has taught for more than thirty years at the Lehigh University Microscopy School and is the author and co-auther of eight books on scanning electron microscopy and x-ray microanalysis. He is an Honorary Fellow of the Royal Microscopical Society and received the Distinguished Scientist Award in Biological Sciences from the Microscope Society of America in 2001.

Introduction
The SEM and Its Modes of Operation
Electron Beam-Specimen Interactions
Image Formation and Interpretation
Special Topics in Scanning Electron Microscopy
Generation of X-Rays in the SEM Specimen
X-Ray Spectral Measurement: EDS and WDS
Qualitative X-Ray Analysis
Quantitative X-Ray Analysis: The Basics
Special Topics in Electron Beam X-Ray Microanalysis
Specimen Preparation of Hard Materials: Metals, Ceramics, Rocks, Minerals, Microelectronic and Packaged Devices, Particles, and Fibers
Specimen Preparation of Polymer Materials
Ambient-Temperature Specimen Preparation of Biological Material
Low-Temperature Specimen Preparation
Procedures for Elimination of Charging in Nonconducting Specimens
Index

×
Free shipping on orders over $35*

*A minimum purchase of $35 is required. Shipping is provided via FedEx SmartPost® and FedEx Express Saver®. Average delivery time is 1 – 5 business days, but is not guaranteed in that timeframe. Also allow 1 - 2 days for processing. Free shipping is eligible only in the continental United States and excludes Hawaii, Alaska and Puerto Rico. FedEx service marks used by permission."Marketplace" orders are not eligible for free or discounted shipping.

Learn more about the TextbookRush Marketplace.

×