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Scanning Electron Microscopy and X-Ray Microanalysis

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ISBN-10: 0306472929

ISBN-13: 9780306472923

Edition: 3rd 2003 (Revised)

Authors: Joseph Goldstein, Patrick Echlin, David C. Joy, Eric Lifshin, Charles E. Lyman

List price: $99.00
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Description:

Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this text emphasises practical aspects of imaging and analysis for a broad audience of students and practitioners whose backgrounds span a wide range of science and technology.
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Book details

List price: $99.00
Edition: 3rd
Copyright year: 2003
Publisher: Springer
Publication date: 4/30/2007
Binding: Mixed Media
Pages: 690
Size: 7.50" wide x 10.50" long x 2.00" tall
Weight: 3.740
Language: English

Jack Kornfield trained as a Buddhist monk in the monasteries of Thailand, India, and Burma. He is a founding teacher of the Insight Meditation Society in Barre, Massachusetts, and Spirit Rock Meditation Center in Woodacre, California, and has taught meditation internationally since 1974. His books include After the Ecstasy, the Laundry and The Art of Forgiveness, Lovingkindness, and Peace.

Patrick Echlin was a lecturer in the Department of Plant Sciences and Director of the Multi-Imaging Centre, School of Biological Science, University of Cambridge until he retired in 1999. He has taught for more than thirty years at the Lehigh University Microscopy School and is the author and co-auther of eight books on scanning electron microscopy and x-ray microanalysis. He is an Honorary Fellow of the Royal Microscopical Society and received the Distinguished Scientist Award in Biological Sciences from the Microscope Society of America in 2001.

Introduction
The SEM and Its Modes of Operation
Electron Beam-Specimen Interactions
Image Formation and Interpretation
Special Topics in Scanning Electron Microscopy
Generation of X-Rays in the SEM Specimen
X-Ray Spectral Measurement: EDS and WDS
Qualitative X-Ray Analysis
Quantitative X-Ray Analysis: The Basics
Special Topics in Electron Beam X-Ray Microanalysis
Specimen Preparation of Hard Materials: Metals, Ceramics, Rocks, Minerals, Microelectronic and Packaged Devices, Particles, and Fibers
Specimen Preparation of Polymer Materials
Ambient-Temperature Specimen Preparation of Biological Material
Low-Temperature Specimen Preparation
Procedures for Elimination of Charging in Nonconducting Specimens
Index