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Quality Engineering Using Robust Design

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ISBN-10: 0137451679

ISBN-13: 9780137451678

Edition: 1st 1989

Authors: Madhav S. Phadke

List price: $95.00
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Description:

Phadke was trained in robust design techniques by Genichi Taguchi, the mastermind behind Japanese quality manufacturing technologies and the father of Japanese quality control. Taguchi's approach is currently under consideration to be adopted as a student protocol with the US govrnment. The foreword is written by Taguchi. This book offers a complete blueprint for structuring projects to achieve rapid completion with high engineering productivity during the research and development phase to ensure that high quality products can be made quickly and at the lowest possible cost. Some topics covered are: orthogonol arrays, how to construct orthogonal arrays, computer-aided robutst design…    
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Book details

List price: $95.00
Edition: 1st
Copyright year: 1989
Publisher: Prentice Hall PTR
Publication date: 5/12/1989
Binding: Paperback
Pages: 352
Size: 7.25" wide x 9.75" long x 0.75" tall
Weight: 1.540
Language: English

Foreword
Preface
Acknowledgments
Introduction
A Historical Perspective
What Is Quality?
Elements of Cost
Fundamental Principle
Tools Used in Robust Design
Applications and Benefits of Robust Design
Organization of the Book
Summary
Principles of Quality Engineering
Quality Loss Function--The Fraction Defective Fallacy
Quadratic Loss Function
Noise Factors--Causes of Variation
Average Quality Loss
Exploiting Nonlinearity
Classification of Parameters: P Diagram
Optimization of Product and Process Design
Role of Various Quality Control Activities
Summary
Matrix Experiments Using Orthogonal Arrays
Matrix Experiment for a CVD Process
Estimation of Factor Effects
Additive Model for Factor Effects
Analysis of Variance
Prediction and Diagnosis
Summary
Steps in Robust Design
The Polysilicon Deposition Process and Its Main Function
Noise Factors and Testing Conditions
Quality Characteristics and Objective Functions
Control Factors and Their Levels
Matrix Experiment and Data Analysis Plan
Conducting the Matrix Experiment
Data Analysis
Verification Experiment and Future Plan
Summary
Signal-To-Noise Ratios
Optimization for Polysilicon Layer Thickness Uniformity
Evaluation of Sensitivity to Noise
S/N Ratios for Static Problems
S/N Ratios for Dynamic Problems
Analysis of Ordered Categorical Data
Summary
Achieving Additivity
Guidelines for Selecting Quality Characteristics
Examples of Quality Characteristics
Examples of S/N Ratios
Selection of Control Factors
Role of Orthogonal Arrays
Summary
Constructing Orthogonal Arrays
Counting Degrees of Freedom
Selecting a Standard Orthogonal Array
Dummy Level Technique
Compound Factor Method
Linear Graphs and Interaction Assignment
Modification of Linear Graphs
Column Merging Method
Branching Design
Strategy for Constructing an Orthogonal Array
Comparison with the Classical Statistical Experiment Design
Summary
Computer Aided Robust Design
Differential Op-Amp Circuit
Description of Noise Factors
Methods of Simulating the Variation in Noise Factors
Orthogonal Array Based Simulation of Variation in Noise Factors
Quality Characteristic and S/N Ratio
Optimization of the Design
Tolerance Design
Reducing the Simulation Effort
Analysis of Nonlinearity
Selecting an Appropriate S/N Ratio
Summary
Design of Dynamic systems
Temperature Control Circuit and Its Function
Signal, Control, and Noise Factors
Quality Characteristics and S/N Ratios
Optimization of the Design
Iterative Optimization
Summary
Tuning Computer Systems for High Performance
Problem Formulation
Noise Factors and Testing Conditions
Quality Characteristic and S/N Ratio
Control Factors and Their Alternate Levels
Design of the Matrix Experiment and the Experimental Procedure
Data Analysis and Verification Experiments
Standardized S/N Ratio
Related Applications
Summary
Reliability Improvement
Role of S/N Ratios in Reliability Improvement
The Routing Process
Noise Factors and Quality Characteristics
Control Factors and Their Levels
Design of the Matrix Experiment
Experimental Procedure
Data Analysis
Survival Probability Curves
Summary
Orthogonality of a Matrix Experiment
Unconstrained Optimization
Standard Orthogonal Arrays and Linear Graphs
References
Index