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Advances in Imaging and Electron Physics

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ISBN-10: 0120147807

ISBN-13: 9780120147809

Edition: 2005

Authors: Peter W. Hawkes

List price: $275.00
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Description:

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Book details

List price: $275.00
Copyright year: 2005
Publisher: Elsevier Science & Technology
Publication date: 11/1/2005
Binding: Hardcover
Pages: 392
Size: 5.94" wide x 9.00" long x 1.00" tall
Weight: 0.726
Language: English

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.

Spectral Color Spaces: Their Structure and Transformations (LENZ)
Phase Contrast Enhancement with Phase Plates in Electron Microscopy (NAGAYAMA)
A Study of Optical Properties of Gas Phase Field Ionization Sources (LIU and Orloff)
On Symmetric and Nonsymmetric Divergence Measures and Their Generalizations (TANEJA)
Features and Future of the International System of Units (SI) (VALDES)
The Importance Sampling Hough Transform (WALSH)