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Modern Developments and Applications in Microbeam Analysis

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ISBN-10: 3211831061

ISBN-13: 9783211831069

Edition: 1998

Authors: G. Love, A. Armigliato, W. A. P. Nicholson

List price: $159.99
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The European Microanalysis Society held its Fifth Workshop in Torquay in May 1997. This volume includes the revised presentations of 12 tutorials and 50 papers from leading experts in the fields covering the following main topics: X-ray spectrometry, analytical electron microscopy, surface studies, bulk analysis, fundamental parameters.
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Book details

List price: $159.99
Copyright year: 1998
Publisher: Springer
Publication date: 7/20/1998
Binding: Paperback
Pages: 392
Size: 7.60" wide x 10.24" long x 0.75" tall
Weight: 2.420
Language: English

Recent Developments in Instrumentation for X-Ray Microanalysis
High Resolution Non Dispersive X-Ray Spectroscopy with State of the Art Silicon Detectors
Efficiency Calibration of a Si(Li) Detector by EPMA
Wavelength-Dispersive X-Ray Spectrometry
X-Ray Spectrum Processing and Multivariate Analysis
Thin Film Analysis and Chemical Mapping in the Analytical Electron Microscope
On the Spatial Resolution in Analytical Electron Microscopy
Contamination in Analytical Electron Microscopy and in ALCHEMI
Analytical Electron Microscopy of Diffusional Interfaces in an Al-22 at. % Zn Alloy
Quantitative TEM-EDXS of Sol-Gel Derived PZT Ceramic Materials
Particulate Composites of TZP-Chromium Oxide and TZP-Chromium Carbide; Microbeam Investigations
Cryo-Electron Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Energy-Dispersive X-Ray Analysis of Ag(Br.I) Nano- and Microcrystals
Electron Energy-Loss Near-Edge Structure of Alumina Polymorphs
SPM Study of YBCO Films Prepared by Plasma Assisted Laser Ablation
Surface Characterisation and Modification of YBCO Thin Films by STM
Quantitative Near-Surface Microanalysis and Depth Profiling by EPMA
EPMA Sputter Depth Profiling. Part I: Theory and Evaluation
EPMA Sputter Depth Profiling. Part II: Experiment
Quantitative Analysis of BN (C, O, Ar, H)-Coatings Using EPMA and SIMS
Quantitative EDS Analysis of SiO[subscript 2]/Al[subscript 2]O[subscript 3]/TiO[subscript 2] Multilayer Films
Surface Ionization of Thin Films on Substrates: Measurement and Simulation
Comparison of Different Methods to Characterize Thin a-Si:H Films
EPMA Studies of the Growth of Thin Surface Coatings Produced by Evaporation
Analysis of Thin Films with Slightly Rough Boundaries
Effect of Chromium Substrate Pretreatment on Diamond Growth by the Chemical Vapour Deposition Method
EPMA Determination of Arsenic Excess in Low Temperature Grown GaAs
EPMA of Melted UO[subscript 2] Fuel Rods from the Phebus-FP Reactor Accident Experiment
Steels, Carbon Concentration, and Microhardness
Determination of Chemical and Phase Composition of Fly-Ashes by Combined EPMA and XRD Methods
EPMA of the Composition of Opal-Based Nanostructured Materials
NDIC and EMP Study of Plagioclase Mineral Zoning: An Example from Nea Kameni Lavas
Compositional X-Ray Maps of Metamorphic and Magmatic Minerals
Chemical Mapping of Weathering Stages in Laterites
Electron Microprobe Determination of Minor and Trace Concentrations of Gold and Platinum Group Elements in Sulphides and Sulpharsenides: Problems, Solutions, and Applications
Composition of 15-17th Century Archaeological Glass Vessels Excavated in Antwerp, Belgium
Potassium Migration in Silica Glass During Electron Beam Irradiation
X-Ray Microanalysis of Frozen-Hydrated Biological Bulk Samples
Environmental SEM and X-Ray Microanalysis of Biological Materials
Effects of Electron-Beam/Gas Interactions on X-Ray Microanalysis in the Variable Pressure SEM
The Analytical Signal in EPMA and the Influence of the Electric Field Created by the Primary Beam
Standardless Analysis
A New Technique for Standardless Analysis by EPMA-TWIX
Stopping Power Factor for Standardless QEPMA
On the Measurement of the Backscattering Coefficient for Low Energy Electrons
Monte Carlo Simulations of Edge Artefacts in MULSAM Images
Assessment of the Inelastic Scattering Model in Monte-Carlo Simulations
A Rapid Comparison of Matrix Corrections in AES and XPS by Means of Computer Programs
Fractals and BaTiO[subscript 3]-Ceramic Microstructure Analysis
Fragmentation of Sputtered Cluster Ions of Transition Metals: Distributions of Lifetimes and Internal Energies
Sputtering of Tantalum by Atomic and Molecular Gold Ions: Comparative Study of Yields and Kinetic Energy Distributions of Atomic and Cluster Ions
The Standards, Measurements and Testing Programme (SMT), the European Support to Standardisation, Measurements and Testing Projects