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| Recent Developments in Instrumentation for X-Ray Microanalysis | |
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| High Resolution Non Dispersive X-Ray Spectroscopy with State of the Art Silicon Detectors | |
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| Efficiency Calibration of a Si(Li) Detector by EPMA | |
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| Wavelength-Dispersive X-Ray Spectrometry | |
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| X-Ray Spectrum Processing and Multivariate Analysis | |
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| Thin Film Analysis and Chemical Mapping in the Analytical Electron Microscope | |
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| On the Spatial Resolution in Analytical Electron Microscopy | |
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| Contamination in Analytical Electron Microscopy and in ALCHEMI | |
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| Analytical Electron Microscopy of Diffusional Interfaces in an Al-22 at. % Zn Alloy | |
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| Quantitative TEM-EDXS of Sol-Gel Derived PZT Ceramic Materials | |
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| Particulate Composites of TZP-Chromium Oxide and TZP-Chromium Carbide; Microbeam Investigations | |
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| Cryo-Electron Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Energy-Dispersive X-Ray Analysis of Ag(Br.I) Nano- and Microcrystals | |
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| Electron Energy-Loss Near-Edge Structure of Alumina Polymorphs | |
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| SPM Study of YBCO Films Prepared by Plasma Assisted Laser Ablation | |
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| Surface Characterisation and Modification of YBCO Thin Films by STM | |
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| Quantitative Near-Surface Microanalysis and Depth Profiling by EPMA | |
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| EPMA Sputter Depth Profiling. Part I: Theory and Evaluation | |
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| EPMA Sputter Depth Profiling. Part II: Experiment | |
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| Quantitative Analysis of BN (C, O, Ar, H)-Coatings Using EPMA and SIMS | |
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| Quantitative EDS Analysis of SiO[subscript 2]/Al[subscript 2]O[subscript 3]/TiO[subscript 2] Multilayer Films | |
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| Surface Ionization of Thin Films on Substrates: Measurement and Simulation | |
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| Comparison of Different Methods to Characterize Thin a-Si:H Films | |
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| EPMA Studies of the Growth of Thin Surface Coatings Produced by Evaporation | |
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| Analysis of Thin Films with Slightly Rough Boundaries | |
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| Effect of Chromium Substrate Pretreatment on Diamond Growth by the Chemical Vapour Deposition Method | |
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| EPMA Determination of Arsenic Excess in Low Temperature Grown GaAs | |
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| EPMA of Melted UO[subscript 2] Fuel Rods from the Phebus-FP Reactor Accident Experiment | |
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| Steels, Carbon Concentration, and Microhardness | |
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| Determination of Chemical and Phase Composition of Fly-Ashes by Combined EPMA and XRD Methods | |
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| EPMA of the Composition of Opal-Based Nanostructured Materials | |
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| NDIC and EMP Study of Plagioclase Mineral Zoning: An Example from Nea Kameni Lavas | |
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| Compositional X-Ray Maps of Metamorphic and Magmatic Minerals | |
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| Chemical Mapping of Weathering Stages in Laterites | |
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| Electron Microprobe Determination of Minor and Trace Concentrations of Gold and Platinum Group Elements in Sulphides and Sulpharsenides: Problems, Solutions, and Applications | |
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| Composition of 15-17th Century Archaeological Glass Vessels Excavated in Antwerp, Belgium | |
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| Potassium Migration in Silica Glass During Electron Beam Irradiation | |
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| X-Ray Microanalysis of Frozen-Hydrated Biological Bulk Samples | |
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| Environmental SEM and X-Ray Microanalysis of Biological Materials | |
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| Effects of Electron-Beam/Gas Interactions on X-Ray Microanalysis in the Variable Pressure SEM | |
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| The Analytical Signal in EPMA and the Influence of the Electric Field Created by the Primary Beam | |
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| Standardless Analysis | |
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| A New Technique for Standardless Analysis by EPMA-TWIX | |
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| Stopping Power Factor for Standardless QEPMA | |
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| On the Measurement of the Backscattering Coefficient for Low Energy Electrons | |
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| Monte Carlo Simulations of Edge Artefacts in MULSAM Images | |
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| Assessment of the Inelastic Scattering Model in Monte-Carlo Simulations | |
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| A Rapid Comparison of Matrix Corrections in AES and XPS by Means of Computer Programs | |
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| Fractals and BaTiO[subscript 3]-Ceramic Microstructure Analysis | |
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| Fragmentation of Sputtered Cluster Ions of Transition Metals: Distributions of Lifetimes and Internal Energies | |
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| Sputtering of Tantalum by Atomic and Molecular Gold Ions: Comparative Study of Yields and Kinetic Energy Distributions of Atomic and Cluster Ions | |
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| The Standards, Measurements and Testing Programme (SMT), the European Support to Standardisation, Measurements and Testing Projects | |
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