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Scanning Probe Microscopy Characterization, Nanofabrication and Device Application of Functional Materials

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ISBN-10: 1402030177

ISBN-13: 9781402030178

Edition: 2005

Authors: Paula Maria Vilarinho, Yossi Rosenwaks, Angus Kingon

List price: $459.00
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As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical…    
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Book details

List price: $459.00
Copyright year: 2005
Publisher: Springer Netherlands
Publication date: 3/2/2005
Binding: Hardcover
Pages: 488
Size: 6.50" wide x 9.50" long x 1.25" tall
Weight: 2.046

Index of Keywords
Preface
On the book
Acknowledgements
Photo of the group
List of Authors
Fundamentals of Functional Materials: Functional Materials
Scaling of Silicon-Based Devices to Submicron Dimensions
Unsolved problems in ferroelectrics for scanning probe micrsocopy
Fundamentals of Scanning Probe Techniques: Principles of Basic and Advanced Scanning Probe Microscopy
Nanoscale probing of physical and chemical functionality with Near-Field Optical Microscopy
Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopy
Expanding the Capabilities of the Scanning Tunneling Microscope
Functions of NC
AFM on atomic scale
Application of Scanning Techniques to Functional Materials: Scanning probe microscopy of piezoelectric and transport phenomena in electroceramic materials
SFM-Based Methods for Ferroelectric Studies
Scanning Tunneling Spectroscopy: Local Density of States and Spin Distribution of Interacting Electron Systems
Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in Functional Ferroelectric Pzt thin Films
Microscale Contact Charging On A Silicon Oxide
Constructive Nanolithography
Nanometer-Scale Electronics and Storage
Contributed papers: STM tips fabrication for critical dimension measurement
Scanning Probe Microscopy Characterization of Ferroelectrics Domains And Domains Walls in KTiOPO4
Imaging local dielectric and mechanical responses with dynamic heterodyned electrostatic force microscopy
AFM Patterning of SrTiO3 Thin Films and Device Applications
Nanoscale investigation of a Rayleigh Wave on LiNbO3
Scanning Capacitance Force Microscopy and Kelvin probe force microscopy of nanostructures embedded in SiO2
Electrical characterisation of III-V buried heterostructure lasers by scanning capacitance microscopy
Probing the Density of States of High Temperature Superconductors with Point Contact Tunneling Spectroscopy
Annealing influence on Co ultrathin film morphology in MBE grown Co/Au bilayers
Correlation between the Surface Relief and Interfaces Structure of Fe/Cr Superlattices and Electromagnetic Waves Penetration
SPM Investigation of Thiolated Gold Nanoparticle Patterns Deposited on Different Self-Assembled Substrates
AFM of guanine adsorbed on HOPG under electrochemical controL
Dynamics in Model Membranes and Dna-Membrane Complexes Using Temperature Controlled Atomic Force Microscopy
Index