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| Foreword | |
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| Preface | |
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| Acknowledgments | |
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| List of Constants | |
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| Introduction | |
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| Surface Analysis | |
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| XPS/ESCA for Surface Analysis | |
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| Historical Perspective | |
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| Physical Basis of XPS | |
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| Sensitivity and Specificity of XPS | |
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| Summary | |
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| Atoms, Ions, And Their Electronic Structure | |
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| Atoms, Ions, and Matter | |
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| Atomic Structure | |
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| Electronic Structure | |
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| Quantum Numbers | |
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| Stationary-State Notation | |
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| Stationary-State Transition Notation | |
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| Stationary States | |
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| Spin Orbit Splitting | |
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| Summary | |
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| Xps Instrumentation | |
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| Prerequisites of X-ray Photoelectron Spectroscopy (XPS) | |
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| Vacuum | |
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| Vacuum Systems | |
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| X-ray Sources | |
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| Standard Sources | |
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| Monochromated Sources | |
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| Gas Discharge Lamps | |
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| Synchrotron Sources | |
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| Electron Sources | |
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| Thermionic Sources | |
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| Ion Sources | |
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| EI Sources | |
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| Energy Analyzers | |
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| CMA | |
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| CHA | |
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| Modes of Operation | |
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| Energy Resolution | |
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| Detectors | |
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| EMs | |
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| Imaging | |
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| Serial Imaging | |
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| Parallel Imaging | |
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| Spatial Resolution | |
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| Summary | |
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| Data Collection and Quantification | |
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| Analysis Procedures | |
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| Sample Handling | |
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| Data Collection | |
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| Energy Referencing | |
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| Charge Compensation | |
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| X-ray and Electron-Induced Damage | |
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| Photoelectron Intensities | |
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| Photoelectron Cross Sections | |
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| The Analyzed Volume | |
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| Electron Path Lengths | |
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| Takeoff Angle | |
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| The Background Signal | |
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| Quantification | |
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| Information as a Function of Depth | |
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| Opening up the Third Dimension | |
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| AR-XPS and Energy-Resolved XPS | |
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| Sputter Depth Profiling | |
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| Summary | |
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| Spectral Interpretation | |
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| Speciation | |
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| Photoelectron Binding Energies | |
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| The Z + 1 Approximation | |
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| Initial State Effects | |
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| Final State Effects | |
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| The Auger Parameter | |
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| Curve Fitting | |
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| Summary | |
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| Some Case Studies | |
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| Overview | |
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| Iodine Impregnation of Single-Walled Carbon Nanotube (SWNT) | |
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| Analysis of Group IIA-IV Metal Oxides | |
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| Analysis of Mixed Metal Oxides of Interest as SOFC Cathodes | |
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| Analysis of YBCO and Related Oxides/ Carbonates | |
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| Summary | |
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| Appendices | |
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| Periodic Table of the Elements | |
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| Binding Energies (B.E.<sub>Xps</sub> Or B.E.<sub>Xrf</sub>) of the Elements | |
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| 1s-3s, 2p-3p, and 3d Values | |
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| 4s-5s, 4p-5p, and 4d Values | |
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| Some Quantum Mechanics Calculations of Interest | |
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| Some Statistical Distributions of Interest | |
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| Gaussian Distribution | |
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| Poisson Distribution | |
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| Lorentzian Distributions | |
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| Some Optical Properties of Interest | |
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| Chromatic Aberrations | |
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| Spherical Aberrations | |
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| Diffraction Limit | |
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| Some Other Spectroscopic/Spectrometric Techniques of Interest | |
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| Photon Spectroscopies | |
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| IR, RAIRS, ATR, and DRIFTS | |
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| Raman, SERS, and TERS | |
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| EDX and WDX | |
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| XRF and TXRF | |
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| Electron Spectroscopies | |
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| UPS | |
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| AES | |
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| EELS, REELS, and HREELS | |
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| Ion Spectroscopies/Spectrometries | |
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| SIMS | |
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| TAP | |
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| Ion Scattering Methods | |
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| Some Microscopies of Interest | |
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| SEM | |
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| HIM | |
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| TEM | |
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| SPM (AFM and STM)-Based Techniques | |
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| Some Reflection/Diffraction Techniques of Interest | |
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| XRD | |
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| GID | |
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| XRR | |
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| LEED | |
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| RHEED | |
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| Technique Abbreviations List | |
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| Instrument-Based Abbreviations | |
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| Glossary of Terms | |
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| Questions and Answers | |
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| Xps Vendors | |
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| References | |
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| Index | |