Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
List price: $119.00
Buy it from $38.67
This item qualifies for FREE shipping
*A minimum purchase of $35 is required. Shipping is provided via FedEx SmartPost® and FedEx Express Saver®. Average delivery time is 1 – 5 business days, but is not guaranteed in that timeframe. Also allow 1 - 2 days for processing. Free shipping is eligible only in the continental United States and excludes Hawaii, Alaska and Puerto Rico. FedEx service marks used by permission."Marketplace" orders are not eligible for free or discounted shipping.
30 day, 100% satisfaction guarantee
If an item you ordered from TextbookRush does not meet your expectations due to an error on our part, simply fill out a return request and then return it by mail within 30 days of ordering it for a full refund of item cost.
Learn more about our returns policy
Description: Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means `meeting the user's needs at a minimum cost.' The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip. The book consists of: Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling; Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test; Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing; Appendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing; Bibliography: over 700 entries.
Rush Rewards U
You have reached 400 XP and carrot coins. That is the daily max!
Limited time offer:
Get the first one free!
All the information you need in one place! Each Study Brief is a summary of one specific subject; facts, figures, and explanations to help you learn faster.
List price: $119.00
Copyright year: 2002
Publication date: 12/15/2004
Size: 7.25" wide x 10.00" long x 1.50" tall
|About the Authors|
|Introduction to Testing|
|VLSI Testing Process and Test Equipment|
|Test Economics and Product Quality|
|Logic and Fault Simulation|
|Combinational Circuit Test Generation|
|Sequential Circuit Test Generation|
|DSP-Based Analog and Mixed-Signal Test|
|Model-Based Analog and Mixed-Signal Test|
|Design for Testability|
|Digital DFT and Scan Design|
|Boundary Scan Standard|
|Analog Test Bus Standard|
|System Test and Core-Based Design|
|The Future of Testing|
|Cyclic Redundancy Code Theory|
|Primitive Polynomials of Degree 1 to 100|
|Books on Testing|