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Encyclopedia of Materials Characterization Surfaces, Interfaces, Thin Films

ISBN-10: 0750691689

ISBN-13: 9780750691680

Edition: 1992

Authors: Richard Brundle, Charles Evans, Shaun Wilson

List price: $235.00
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Description:

Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.
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Book details

List price: $235.00
Copyright year: 1992
Publisher: Elsevier Science & Technology Books
Publication date: 8/18/1992
Binding: Hardcover
Pages: 800
Size: 6.75" wide x 9.75" long x 1.50" tall
Weight: 2.640
Language: English

Imaging Techniques, Elemental, Chemical, and Structural Analysis in Electron Beam Column Instruments, Structure Determination by Electron/X-Ray Diffraction/Scattering, Electron Emission Spectroscopies, X-Ray Absorption and Emission Spectroscopies, Visible/UV Emission nad Reflection, Vibrational Spectroscopies and NMR, Ion Scattering Techniques, Mass Spectroscopy and Optical Techniques, Neutron and Nuclear Techniques, Physical and Magnetic Properties