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Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

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ISBN-10: 052184875X

ISBN-13: 9780521848756

Edition: 2nd 2005 (Revised)

Authors: S. J. B. Reed

List price: $113.00
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Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment…    
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Book details

List price: $113.00
Edition: 2nd
Copyright year: 2005
Publisher: Cambridge University Press
Publication date: 8/25/2005
Binding: Hardcover
Pages: 232
Size: 7.25" wide x 10.00" long x 0.50" tall
Weight: 1.298
Language: English

Electron-specimen interactions
Scanning electron microscopy
X-ray spectrometers
Element mapping
X-ray analysis (1)
X-ray analysis (2)
Sample preparation