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Microstructural Characterization of Materials

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ISBN-10: 0471985023

ISBN-13: 9780471985020

Edition: 1999

Authors: David D. Brandon, Wayne D. Kaplan

List price: $135.00
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Description:

This text is an integrated treatment of the science of microstructural characterization which emphasises interaction of the specimen with radiation used to probe the microstructure. Suitable problems for student exercises are included.
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Book details

List price: $135.00
Copyright year: 1999
Publisher: John Wiley & Sons, Incorporated
Publication date: 7/16/1999
Binding: Paperback
Pages: 424
Size: 6.75" wide x 9.25" long x 1.00" tall
Weight: 1.386
Language: English

The Concept of Microstructure
Microstructural Features
Crystallography & Crystal Structure
Summary
Bibliography
Worked Examples
Problems
Diffraction Analysis of Crystal Structure
Scattering Of Radiation By Crystals
Reciprocal Space
X-Ray Diffraction Methods
Diffraction Analysis
Electron Diffraction
Summary
Bibliography
Worked Examples
Problems
Optical Microscopy
Geometrical Optics
Construction Of The Microscope
Specimen Preparation
Image Contrast
Working With Digital Images
Resolution, contrast & image interpretation
Summary
Bibliography
Worked Examples
Problems
Transmission Electron Microscopy
Basic Principles
Specimen Preparation
The Origin of Contrast
Kinematic Interpretation of Diffraction Contrast
Dynamic Diffraction & Absorption Effects
Lattice Imaging at High Resolution
Scanning Transmission Electron Microscopy
Summary
Bibliography
Worked Examples
Problems
Scanning Electron Microscopy
Components of The Scanning Electron Microscope
Electron Beam - Specimen Interactions
Electron Excitation of X-Rays
Back-Scattered Electrons
Secondary Electron Emission
Alternative Imaging Modes
Specimen Preparation & Topology
Focused Ion Beam Microscopy
Summary
Bibliography
Worked Examples
Problems
Microanalysis in Electron Microscopy
X-Ray Microanalysis
Electron Energy-Loss Spectroscopy
Summary
Bibliography
Worked Examples
Problems
Scanning Probe Microscopy & Related Techniques
Surface Forces & Surface Morphology
Scanning Probe Microscopes
Field-ion Microscopy & Atom-Probe Tomography
Summary
Bibliography
Problems
Chemical Analysis of Surface Composition
X-Ray Photoelectron Spectroscopy
Auger Electron Spectroscopy
Secondary-Ion Mass Spectrometry
Summary
Bibliography
Worked Examples
Problems
Quantitative & Tomographic Analysis of Microstructure
Basic Stereological Concepts
Accessible & Inaccessible Parameters
Optimizing Accuracy
Automated Image Analysis
Tomography & 3-D Reconstruction
Summary
Bibliography
Worked Examples
Problems
Appendices
Index