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Surface Analysis The Principal Techniques

ISBN-10: 0471972924

ISBN-13: 9780471972921

Edition: 1997

Authors: John C. Vickerman

List price: $90.00
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Description:

In today's world there are vast areas of materials technology some of which do, and some of which would, benefit from the application of surface analysis techniques in both research and in quality control. In Surface Analysis experts in each analysis area introduce the theory and practice of the principal techniques which have shown themselves to be effective in both basic research and in applied surface analysis. The book brings the reader to a level of knowledge where they can understand data generated by each technique and see how it relates to the type of problems they wish to tackle. The coverage is thorough without being too detailed. Examples of analysis are provided in each case, and review questions at the close of most chapters help the reader to reinforce what has been learnt. Thus the book will be an appropriate text for specialist undergraduate courses in materials analysis and for post-graduate M. Sc. and Ph.D. students in materials and surface science. Industrial analytical scientists will find the book an invaluable introduction to bring rapid familiarity with the capabilities of the various techniques.
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Book details

List price: $90.00
Copyright year: 1997
Publisher: John Wiley & Sons, Incorporated
Publication date: 10/20/1997
Binding: Paperback
Pages: 474
Size: 6.25" wide x 9.25" long x 1.00" tall
Weight: 1.496

Growing up in a small town with no cable (and parents who were teachers), reading was the only thing to do. Since then, Christianne Jones has read about a bazillion books and written more than 50. Christianne works as an editor and lives in Minnesota with her husband and three daughters.

Vacuum Technology for Applied Surface Science
Electron Spectroscopy for Chemical Analysis
Auger Electron Spectroscopy
Secondary Ion Mass Spectroscopy-the Surface Mass Spectrometry
Low-Energy Ion Scattering and Rutherford Backscattering
Vibrational Spectroscopy from Surfaces
Surface Structure Determination by Interference Techniques
Scanning Tunnelling Microscopy and Atomic Force Microscopy
Index