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Preface to the Third Edition | |
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Newton, Fizeau, and Haidinger Interferometers | |
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Introduction | |
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Newton Interferometer | |
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Source and Observer''s Pupil Size Considerations | |
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Some Suitable Light Sources | |
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Materials for the Optical Flats | |
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Simple Procedure for Estimating Peak Error | |
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Measurement of Spherical Surfaces | |
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Measurement of Aspheric Surfaces | |
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Measurement of Flatness of Opaque Surfaces | |
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Fizeau Interferometer | |
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The Basic Fizeau Interferometer | |
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Coherence Requirements for the Light Source | |
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Quality of Collimation Lens Required | |
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Liquid Reference Flats | |
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Fizeau Interferometer with Laser Source | |
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Multiple-Beam Fizeau Setup | |
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Testing Nearly Parallel Plates | |
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Testing the Inhomogeneity of Large Glass or Fused Quartz Samples | |
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Testing the Parallelism and Flatness of the Faces of Rods, Bars and Plates | |
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Testing Cube Corner and Right-Angle Prisms | |
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Fizeau Interferometer for Curved Surfaces | |
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Testing Concave and Convex Surfaces | |
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Haidinger Interferometer | |
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Applications of Haidinger Fringes | |
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Use of Laser Source for Haidinger Interferometer | |
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Other Applications of Haidinger Fringes | |
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Absolute Testing of Flats | |
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Twyman-Green Interferometer | |
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Introduction | |
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Beam-Splitter | |
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Optical Path Difference Introduced by the Beam Splitter Plate | |
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Required Accuracy in the Beam Splitter Plate | |
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Cube Beam Splitter | |
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Coherence Requirements | |
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Spatial Coherence | |
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Temporal Coherence | |
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Uses of a Twyman-Green Interferometer | |
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Testing of Prisms and Diffraction Rulings | |
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Testing of Lenses | |
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Testing of Microscope Objectives | |
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Compensation of Intrinsic Aberrations in the Interferometer | |
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Unequal-Path Interferometer | |
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Some Special Designs | |
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Improving the Fringe Stability | |
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Open Path Interferometers | |
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Mach-Zehnder Interferometers | |
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Triangular Interferometers | |
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Oblique Incidence Interferometers | |
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Variations from the Twyman-Green Configuration | |
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Interferometers with Diffractive Beam Splitters | |
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Phase Conjugating Interferometer | |
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Typical Interferograms and their Analysis | |
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Analysis of Interferograms of Arbitrary Wavefronts | |
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Common-Path Interferometers | |
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Introduction | |
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Burch''s Interferometer Employing Two Matched Scatter Plates | |
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Fresnel Zone Plate Interferometer | |
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Burch and Fresnel Zone Plate Interferometer for Aspheric Surfaces | |
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Burch and fresnel Zone Plate Interferometers for Phase Shifting | |
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Birefringent Beam Splitters | |
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Savart Polariscope | |
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Wollaston Prism | |
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Double-Focus Systems | |
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Lateral Shearing Interferometers | |
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Use of a Savart Polariscope | |
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Use of a Wollaston Prism | |
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Double-Focus Interferometer | |
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Saunders''s Prism Interferometer | |
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Point Diffraction Interferometer | |
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Zernike Tests with Common-Path Interferometers | |
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Measurement of the Optical Transfer Function | |
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Lateral Shear Interferometers | |
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Introduction | |
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Coherence Properties of the Light Source | |
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Brief Theory of Lateral Shearing Interferometry | |
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Interferograms of Spherical and Flat Wavefronts | |
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Interferogams of Primary Aberrations upon Lateral Shear | |
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Evaluation of an Unknown Wavefront | |
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Lateral Shearing Interferometers in Collimated Light (White Light Compensated) | |
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Arrangements Based on the Jamin Interferometer | |
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Arrangements Based on the Michelson Interferometer | |
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Arrangements Based on a Cyclic Interferometer | |
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Arrangements Based on the Mach-Zehnder Interferometer | |
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Lateral Shearing Interferometers in Convergent Light (White-light Compensated) | |
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Arrangements Based on the Michelson Interferometer | |
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Arrangements Based on the Mach-Zehnder Interferometer | |
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Lateral Shearing Interferometers Using Lasers | |
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