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Transmission Electron Microscopy A Textbook for Materials Science

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ISBN-10: 030645324X

ISBN-13: 9780306453243

Edition: 1st 2004

Authors: David B. Williams, C. Barry Carter

List price: $99.00
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Description:

This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.
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Book details

List price: $99.00
Edition: 1st
Copyright year: 2004
Publisher: Springer
Publication date: 9/30/1996
Binding: Paperback
Pages: 703
Size: 8.75" wide x 11.00" long x 1.50" tall
Weight: 4.180
Language: English

Basics
The Transmission Electron Microscope
Scattering and Diffraction
Elastic Scattering
Inelastic Scattering and Beam Damage
Electron Sources
Lenses, Apertures, and Resolution
How to `See' Electrons
Pumps and Holders
The Instrument
Specimen Preparation. Diffraction
Diffraction Patterns
Thinking in Reciprocal Space
Diffracted Beams
Bloch Waves
Dispersion Surfaces
Diffraction from Crystals
Diffraction from Small Volumes
Indexing Diffraction Patterns
Kikuchi Diffraction
Obtaining CBED Patterns
Using Covergent-Beam Technologies. Imaging
Imaging in the TEM
Thickness and Bending Effects
Planar Defects
Strain Fields
WeakBeam Dark-Field Microscopy
Phase-Contrast Images
High-Resolution TEM
Image Simulation
Quantifying and Processing HRTEM Images
Other Imaging Techniques. Spectrometry
Xray Spectrometry
The XEDS-TEM Interface
Qualitative Xray Analysis
Quantitative Xray Microanalysis
Spatial Resolution and Minimum Detectability
Electron EnergyLoss Spectrometers
The EnergyLoss Spectrum
Microanalysis with Ionization-Loss Electrons
Everything Else in the Spectrum
Index