Transmission Electron Microscopy A Textbook for Materials Science

Name: Transmission Electron Microscopy A Textbook for Materials Science
Price: 24.63 USD
Availability: InStock
ISBN: 9780306453243

ISBN-10: 030645324X

ISBN-13: 9780306453243

Edition: 1st 2004

Authors: David B. Williams, C. Barry Carter

List price: $99.00

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Description:

This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Book details

List price: $99.00
Edition: 1st
Copyright year: 2004
Publisher: Springer
Publication date: 9/30/1996
Binding: Paperback
Pages: 703
Size: 8.75" wide x 11.00" long x 1.50" tall
Weight: 4.180
Language: English



Basics



The Transmission Electron Microscope



Scattering and Diffraction



Elastic Scattering



Inelastic Scattering and Beam Damage



Electron Sources



Lenses, Apertures, and Resolution



How to `See' Electrons



Pumps and Holders



The Instrument



Specimen Preparation. Diffraction



Diffraction Patterns



Thinking in Reciprocal Space



Diffracted Beams



Bloch Waves



Dispersion Surfaces



Diffraction from Crystals



Diffraction from Small Volumes



Indexing Diffraction Patterns



Kikuchi Diffraction



Obtaining CBED Patterns



Using Covergent-Beam Technologies. Imaging



Imaging in the TEM



Thickness and Bending Effects



Planar Defects



Strain Fields



WeakBeam Dark-Field Microscopy



Phase-Contrast Images



High-Resolution TEM



Image Simulation



Quantifying and Processing HRTEM Images



Other Imaging Techniques. Spectrometry



Xray Spectrometry



The XEDS-TEM Interface



Qualitative Xray Analysis



Quantitative Xray Microanalysis



Spatial Resolution and Minimum Detectability



Electron EnergyLoss Spectrometers



The EnergyLoss Spectrum



Microanalysis with Ionization-Loss Electrons



Everything Else in the Spectrum


Index