Advances in X-Ray Analysis

Name: Advances in X-Ray Analysis
Availability: OutOfStock
ISBN: 9780306417122

ISBN-10: 030641712X

ISBN-13: 9780306417122

Edition: N/A

Authors: Jerome Bernard Cohen, John C. Russ, Donald E. Leyden, Charles S. Barrett, Paul K. Predecki

List price: $178.00

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Description:

This volume constitutes the proceedings of the 1983 Denver Conference on Applications of X-ray Analysis and is the 27th in the series. The conference was held jointly with the American Crystal lographic Association at Snowmass Resort, Colorado, from August 1 to 5, 1983. The papers appearing in this volume are only from pre dominantly Denver Conference (DC) sessions and from joint DC/ACA sessions. The early plans for holding a joint conference were initiated some three years ago by Q. C. Johnson of Lawrence Livermore Lab, J. B. Cohen of Northwestern University and P. K. Predecki of the University of Denver and were eventually brought to fruition by a jOint organizing committee consisting…

Book details

List price: $178.00
Publisher: Basic Books
Binding: Hardcover
Pages: 596
Size: 6.75" wide x 9.75" long x 1.25" tall
Weight: 2.640
Language: English