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Introduction to Mixed-Signal IC Test and Measurement

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ISBN-10: 0195140168

ISBN-13: 9780195140163

Edition: 2001

Authors: Mark Burns, Gordon W. Roberts

List price: $149.00
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Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. This book was written in response ot the shortage of basic course material for mixed-signa test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This material is desinged to be useful as both a university textbook and as a reference manual for the beginning professional test engineer. The prerequisite for this book is a junior level course in linear continuous-time and discrete-time systems, as well as exposure ot elementary probability and statistical concepts. Chapter 1 presents an introduction to the context in which mixed-singal testing is performed and why it is necessary. Chapter 2 examines the process by which test programs are generated, from device data sheet to test plan to test code. Test program structure and functionality are also discussed in Chapter 2. Chapter 3 introduces basic DC measurement definitions, including continuity, leakage, offset, gain, DC power supply rejection ratio, and many other types of fundamental DC measurements. Chapter 4 covers the basics of absolute accuracy, resolution, software calibration, standards traceability, and measurement repeatability. In addition, basic data analysis is presented in Chapter 4. A more thorough treatment of data analysis and statistical analysis is delayed until Chapter 15. Chapter 5 takes a closer look at the architecture of a generic mixed-signal ATE tester. The generic tester includes instruments such as DC sources, meters, waveform digitizers, arbitrary waveform generators, and digital pattern generators with source and capture functionality. Chapter 6 presents an introduction to both ADC and DAC sampling theory. DAC sampling theory is applicable to both DAC circuits in the device under test and to the arbitrary waveform generators in a mixed-signal tester. ADC sampling theory is applicable to both ADC circuits in the device under test and to waveform digitizers in a mixed-signal tester. Coherent multi-tone sample sets are also introduced as an introduction to DSP based testing. Chapter 7 further develops sampling theory concepts and DSP-based testing methodologies, which are at the core of many mixed-signal test and measurement techniques. FFT fundamentals, windowing, frequency domain filtering, and other DSP-based testing fundamentals are covered in Chapter 6 and 7. Chapter 8 shows how basic AC channel tests can be performed economicaly using DSP-based testing. This chapter covers only non-sampled channels, consisting of combinations of op-amps, analog filters, PGAs and other continuous-time circuits. Chapter 9 explores many of these same tests as they are applied to sampled channels, which include DACs, ADCs, sample and hold (S/H) amplifiers, etc. Chapter 10 explains how the basic accuracy of ATE test equipment can be extended using specialized software routines. This subject is not necessarily taught in formal ATE tester classes, yet it is critical in the accurate measurement of many DUT performance parameters. Testing of DACs is covered in Chapter 11. Several kinds of DACs are studied, including traditional binary-weighted, resistive ladder, pulse with modulation
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Book details

List price: $149.00
Copyright year: 2001
Publisher: Oxford University Press, Incorporated
Publication date: 12/14/2000
Binding: Hardcover
Pages: 704
Size: 8.25" wide x 9.75" long x 1.75" tall
Weight: 3.300
Language: English

Overview of Mixed-Signal Testing
Mixed-Signal Ciruits
Why Test Mixed-Signal Devices
Post-Silicon Production Flow
Test and Diagnostic Equipment
New Product Development
Mixed-Signal Testing Challenges
The Test Specification Process
Device Data Sheets
Generating the Test Plan
Components of a Test Program
DC and Parametric Measurements
Leakage Currents
Power Supply Currents
DC References and Regulators
Impedance Measurements
DC Offset Measurements
DC Gain Measurements
DC Power Supply Rejection Ratio
DC Common Mode Rejection Ratio
Comparator DC Tests
Voltage Search Techniques
DC Tests for Digital Circuits
Measurement Accuracy
Calibrations and Checkers
Dealing with Measurement Error
Basic Data Analysis
Tester Hardware
Mixed-Signal Tester Overview
DC Resources
Digital Subsystem
AC Source and Measurement
Time Measurement System
Computing Hardware
Sampling Theory
Analog Measurements Using DSP
Sampling and Reconstruction
Repetitive Sample Sets
Synchronization of Sampling Systems
DSP-Based Testing
Advantages of DSP-Based Testing
Digital Signal Processing
Discrete-Time Transforms
The Inverse FFT
Analog Channel Testing
Gain and Level Tests
Phase Tests
Distortion Tests
Signal Rejection Tests
Noise Tests
Simulation of Analog Channel Tests
Sampled Channel Testing
Sampling Considerations
Encoding and Decoding
Sampled Channel Tests
Focused Calibrations
DC Calibrations
AC Amplitude Calibrations
Other AC Calibrations
Error Cancellation Techniques
DAC Testing
Basics of Converter Testing
Basic DC Tests
Transfer Curve Tests
Dynamic DAC Tests
DAC Architectures
ADC Testing
ADC Testing Versus DAC Testing
ADC Code Edge Measurements
DC Tests and Transfer Curve Tests
Dynamic ADC Tests
ADC Architectures
Tests for Common ADC Applications
DIB Design
DIB Basics
Printed Circuit Boards (PCBS)
DIB Traces, Shields, and Guards
Transmission Lines
Grounding and Power Distribution
DIB Components
Common DIB Circuits
Common DIB Mistakes
Design for Test (DfT)
Advantages of DfT
Digital Scan
Digital BIST
Digital DfT for Mixed-Signal Circuits
Mixed-Signal Boundary Scan and BIST
Ad Hoc Mixed-Signal DfT
Subtle Forms of Analog DFT
Data Analysis
Introduction to Data Analysis
Data Visualization Tools
Statistical Analysis
Statistical Process Control (SPC)
Test Economics
Profitability Factors
Direct Testing Costs
Debugging Skills
Emerging Trends