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Solder Joint Reliability of BGA, CSP, Flip Chip, and Fine Pitch SMT Assemblies

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ISBN-10: 0070366489

ISBN-13: 9780070366480

Edition: 1997

Authors: John H. Lau, Yi-Hsin Pao

List price: $65.00
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As electronic components and their sub-assemblies diminish in size, soldered joint reliability problems increase. The authors of this book, both experts in the field, offer theoretical and practical advice on how to achieve consistent quality soldering.
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Book details

List price: $65.00
Copyright year: 1997
Publisher: McGraw-Hill Professional Publishing
Binding: Hardcover
Pages: 408
Size: 6.50" wide x 9.50" long x 1.25" tall
Weight: 1.848
Language: English

John H. Lau received his Ph.D. degree in Theoretical and Applied Mechanics from the University of Illinois (1977), a M.A.Sc. degree in Structural Engineering from the University of British Columbia (1973), a second M.S. degree in Engineering Physics from the University of Wisconsin (1974), and a third M.S. degree in Management Science from Fairleigh Dickinson University (1981). He also has a B.E. degree in Civil Engineering from National Taiwan University (1970). John is an interconnection technology scientist at Agilent Technologies, Inc. His current interests cover a broad range of electronic and optoelectronic packaging and manufacturing technology. Prior to Agilent, he worked for…    

Introduction
Reliability Testing and Data Analysis
Failure Analysis
Design for Reliability
Solder Joint Reliability of BGA Assemblies
Solder Joint Reliability of Flip Chip Assemblies
Solder Joint Reliability of CSP.Solder Joint Reliability of Fine Pitch SMT Assemblies