Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
List Price: $153.00
Publisher: Springer London, Limited
Binding: Trade Cloth
Size: 6.25" wide x 9.25" long x 1.50" tall
"Materials and Reliability Handbook for Semiconductor Optical and Electron Devices" provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation More...
Osamu Ueda earned his Ph.D. in physical engineering from the University of Tokyo. Ueda is a senior researcher at Fujitsu Laboratories Ltd., Japan. Dr. Ueda has written more than 100 professional papers and is a member of the Society of Applied Physics, the Society of Electron Microscopy, the Electrochemical Society, and the Materials Research Society.
Fan Ren works with the University of Florida, Gainesville.Stephen J. Pearton works with the University of Florida, Gainesville.
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