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Advanced Trace Analysis

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ISBN-10: 8184870299

ISBN-13: 9788184870299

Edition: 2010

Authors: Susanta Lahiri

List price: $66.00
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Description:

Advanced Trace Analysis in six chapters, by eminent scientists, discusses statistical approaches to verify trace element analysis data, trace analysis techniques like ICPMS and XRF, ion beam analysis techniques, speciation analysis of uranium relevant to waste disposal and management along with the use of greener techniques for trace elemental speciation analysis.
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Book details

List price: $66.00
Copyright year: 2010
Publisher: Narosa Publishing House
Publication date: 1/30/2010
Binding: Hardcover
Pages: 188
Size: 7.28" wide x 9.45" long x 0.50" tall
Weight: 1.298
Language: English