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    Advanced Trace Analysis:

    ISBN-10: 8184870299
    ISBN-13: 9788184870299
    Author(s): Susanta Lahiri
    Description: Advanced Trace Analysis in six chapters, by eminent scientists, discusses statistical approaches to verify trace element analysis data, trace analysis techniques like ICPMS and XRF, ion beam analysis techniques, speciation analysis of uranium  More...
    Buy it from: $65.61
    This item will ship on Friday, December 26 .

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    List Price: $89.95
    Publisher: Morgan & Claypool
    Binding: Cloth Text 
    Size: 7.25" wide x 9.50" long x 0.50" tall
    Weight: 1.298
    Language: English

    Advanced Trace Analysis in six chapters, by eminent scientists, discusses statistical approaches to verify trace element analysis data, trace analysis techniques like ICPMS and XRF, ion beam analysis techniques, speciation analysis of uranium relevant to waste disposal and management along with the use of greener techniques for trace elemental speciation analysis.

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