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    Transmission Electron Microscopy and Diffractometry of Materials:

    ISBN-10: 3642297609
    ISBN-13: 9783642297601
    Author(s): B. Fultz, J. Howe
    Description: This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography,  More...
    List price: $129.00
    Buy it from: $131.36

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    Publisher: Springer Verlag
    Binding: Cloth Text 
    Pages: 820
    Size: 6.50" wide x 9.50" long x 2.00" tall
    Weight: 3.102
    Language: English

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