Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

ISBN-10: 0792379918
ISBN-13: 9780792379911
Edition: 2002
List price: $119.00 Buy it from $38.06
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Description: Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential  More...

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Book details

List price: $119.00
Copyright year: 2002
Publisher: Springer
Publication date: 12/15/2004
Binding: Hardcover
Pages: 690
Size: 7.25" wide x 10.00" long x 1.50" tall
Weight: 3.256
Language: English

Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means `meeting the user's needs at a minimum cost.' The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip. The book consists of: Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling; Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test; Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing; Appendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing; Bibliography: over 700 entries.

Preface
About the Authors
Introduction to Testing
Introduction
VLSI Testing Process and Test Equipment
Test Economics and Product Quality
Fault Modeling
Test Methods
Logic and Fault Simulation
Testability Measures
Combinational Circuit Test Generation
Sequential Circuit Test Generation
Memory Test
DSP-Based Analog and Mixed-Signal Test
Model-Based Analog and Mixed-Signal Test
Delay Test
IDDQ Test
Design for Testability
Digital DFT and Scan Design
Built-In Self-Test
Boundary Scan Standard
Analog Test Bus Standard
System Test and Core-Based Design
The Future of Testing
Cyclic Redundancy Code Theory
Primitive Polynomials of Degree 1 to 100
Books on Testing
Bibliography
Index

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