Electron Microscopy and Analysis

ISBN-10: 0748409688
ISBN-13: 9780748409686
Edition: 3rd 2000 (Revised)
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Description: Dealing with several sophisticated techniques for magnifying images of very small objects by large amounts, this text contains a question and answer section and is thoroughly illustrated through out.

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Book details

Edition: 3rd
Copyright year: 2000
Publisher: Taylor & Francis Group
Publication date: 11/30/2000
Binding: Paperback
Pages: 254
Size: 6.00" wide x 9.00" long x 0.50" tall
Weight: 1.034
Language: English

Dealing with several sophisticated techniques for magnifying images of very small objects by large amounts, this text contains a question and answer section and is thoroughly illustrated through out.

Acronyms
Preface
Microscopy with light and electrons
Introduction
Methods of image formation
Pixels
The light-optical microscope
Magnification
Resolution
Depth of field and depth of focus
Aberrations in optical systems
Electrons versus light
Questions
Electrons and their interaction with the specimen
Introduction
Electrons
Generating a beam of electrons
Deflection of electrons--magnetic lenses
The scattering of electrons by atoms
Elastic scattering
Inelastic scattering
Secondary effects
The family of electron microscopes
Questions
Electron diffraction
The geometry of electron diffraction
Diffraction spot patterns
Use of the reciprocal lattice in diffraction analysis
Other types of diffraction pattern
Questions
The transmission electron microscope
The instrument
Contrast mechanisms
High voltage electron microscopy (HVEM)
Scanning transmission electron microscopy (STEM)
Preparation of specimens for TEM
Questions
The scanning electron microscope
How it works
Obtaining a signal in the SEM
The optics of the SEM
The performance of the SEM
The ultimate resolution of the SEM
Topographic images
Compositional images
Crystallographic information from the SEM
The use of other signals in the SEM
Image acquisition, processing and storage
The preparation of specimens for examination in the SEM
Low voltage microscopy
Environmental scanning electron microscopy (ESEM)
Questions
Chemical analysis in the electron microscope
The generation of X-rays within a specimen
Detection and counting of X-rays
X-ray analysis of bulk specimens
X-ray analysis of thin specimens in the TEM
Quantitative analysis in an electron microscope
Electron energy loss spectroscopy (EELS)
A brief comparison of techniques
Questions
Electron microscopy and other techniques
Complementary imaging techniques
Complementary analysis techniques--alternative analysis systems
Complementary diffraction techniques
Summary
Questions
Further reading
Answers
Index

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