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| Acronyms | |
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| Preface | |
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| Microscopy with light and electrons | |
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| Introduction | |
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| Methods of image formation | |
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| Pixels | |
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| The light-optical microscope | |
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| Magnification | |
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| Resolution | |
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| Depth of field and depth of focus | |
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| Aberrations in optical systems | |
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| Electrons versus light | |
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| Questions | |
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| Electrons and their interaction with the specimen | |
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| Introduction | |
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| Electrons | |
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| Generating a beam of electrons | |
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| Deflection of electrons--magnetic lenses | |
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| The scattering of electrons by atoms | |
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| Elastic scattering | |
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| Inelastic scattering | |
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| Secondary effects | |
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| The family of electron microscopes | |
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| Questions | |
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| Electron diffraction | |
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| The geometry of electron diffraction | |
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| Diffraction spot patterns | |
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| Use of the reciprocal lattice in diffraction analysis | |
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| Other types of diffraction pattern | |
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| Questions | |
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| The transmission electron microscope | |
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| The instrument | |
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| Contrast mechanisms | |
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| High voltage electron microscopy (HVEM) | |
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| Scanning transmission electron microscopy (STEM) | |
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| Preparation of specimens for TEM | |
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| Questions | |
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| The scanning electron microscope | |
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| How it works | |
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| Obtaining a signal in the SEM | |
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| The optics of the SEM | |
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| The performance of the SEM | |
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| The ultimate resolution of the SEM | |
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| Topographic images | |
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| Compositional images | |
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| Crystallographic information from the SEM | |
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| The use of other signals in the SEM | |
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| Image acquisition, processing and storage | |
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| The preparation of specimens for examination in the SEM | |
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| Low voltage microscopy | |
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| Environmental scanning electron microscopy (ESEM) | |
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| Questions | |
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| Chemical analysis in the electron microscope | |
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| The generation of X-rays within a specimen | |
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| Detection and counting of X-rays | |
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| X-ray analysis of bulk specimens | |
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| X-ray analysis of thin specimens in the TEM | |
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| Quantitative analysis in an electron microscope | |
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| Electron energy loss spectroscopy (EELS) | |
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| A brief comparison of techniques | |
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| Questions | |
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| Electron microscopy and other techniques | |
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| Complementary imaging techniques | |
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| Complementary analysis techniques--alternative analysis systems | |
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| Complementary diffraction techniques | |
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| Summary | |
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| Questions | |
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| Further reading | |
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| Answers | |
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| Index | |