Structure and Imperfections in Amorphous and Crystalline Silicon Dioxide

Name: Structure and Imperfections in Amorphous and Crystalline Silicon Dioxide
Price: 39.3 USD
Availability: InStock
ISBN: 9780471975366

ISBN-10: 0471975362

ISBN-13: 9780471975366

Edition: 2000

Authors: R. A. B. Devine, J. -P. Duraud, E. Dooryhï¿½e, E. Dooryhï¿½e

List price: $561.50

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Description:

Silicon dioxide is one of the most prolific materials to be found in the earth's crust and has significance in technological applications. This text presents an overview of silicon technology, treating both amorphous and crystalline phases.

Book details

List price: $561.50
Copyright year: 2000
Publisher: John Wiley & Sons, Incorporated
Publication date: 5/18/2000
Binding: Hardcover
Pages: 528
Size: 6.25" wide x 9.50" long x 1.25" tall
Weight: 1.892
Language: English



Contributors


Preface



Topological Models for the Crystalline and Amorphous Phases



Description of the Atomic Arrangement in SiO[subscript 2] Polymorphs



The Topology of Silica Networks




Low-Pressure Crystalline Phases of SiO[subscript 2]




Theoretical Investigations of the Structure of Amorphous SiO[subscript 2] at Elevated Pressure




Experimental Analysis of SiO[subscript 2] Atomic Networks



Nuclear Magnetic Resonance as a Structural Probe of SiO[subscript 2]




Neutron and X-Ray Scattering Studies of Vitreous Silica




Electronic Structure of the Si-O[subscript 2] Bond and the Extended Network



Calculations and Modelling of the Electronic Structure



Molecules as a Basis for Modeling the Force Field of Silica




First Principles Calculation of the Electronic Structures of Crystalline and Amorphous Forms of SiO[subscript 2]




The Electronic Structure of Silica Using Ab Initio Pseudopotentials




Experimental Analysis of the Electronic Structure



X-Ray Absorption Near Edge Structures of SiO[subscript 2]




Electron Energy Loss Structures of SiO[subscript 2]




Macroscopic and Point Defects



Theory of Electronic and Structural Properties of Point Defects in SiO[subscript 2]




Radiation-Induced Defects and Electronic Modification




Transient Defects and Electronic Excitation




Radiation-Induced Defects and Structural Modifications




Processing and Applications of Crystalline and Amorphous Phases



Quartz Oscillators




Science and Technology of Silica Lightguides for Telecommunications




Microstructure, Surface Chemistry, and Properties of Silica Gels



Index