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Preface | |
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About the Authors | |
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Acknowledgments | |
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Introduction | |
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Historical Development of Microelectronics | |
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Evolution of Microsensors | |
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Evolution of MEMS | |
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Emergence of Micromachines | |
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References | |
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Electronic Materials and Processing | |
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Introduction | |
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Electronic Materials and their Deposition | |
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Oxide Film Formation by Thermal Oxidation | |
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Deposition of Silicon Dioxide and Silicon Nitride | |
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Polysilicon Film Deposition | |
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Pattern Transfer | |
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The Lithographic Process | |
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Mask Formation | |
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Resist | |
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Lift-off Technique | |
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Etching Electronic Materials | |
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Wet Chemical Etching | |
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Dry Etching | |
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Doping Semiconductors | |
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Diffusion | |
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Ion Implantation | |
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Concluding Remarks | |
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References | |
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MEMS Materials and their Preparation | |
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Overview | |
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Atomic Structure and the Periodic Table | |
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Atomic Bonding | |
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Crystallinity | |
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Metals | |
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Physical and Chemical Properties | |
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Metallisation | |
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Semiconductors | |
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Semiconductors: Electrical and Chemical Properties | |
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Semiconductors: Growth and Deposition | |
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Ceramic, Polymeric, and Composite Materials | |
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References | |
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Standard Microelectronic Technologies | |
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Introduction | |
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Wafer Preparation | |
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Crystal Growth | |
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Wafer Manufacture | |
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Epitaxial Deposition | |
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Monolithic Processing | |
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Bipolar Processing | |
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Characteristics of BJTs | |
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MOS Processing | |
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Characteristics of FETs | |
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SOI CMOS Processing | |
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Monolithic Mounting | |
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Die Bonding and Wire Bonding | |
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Tape-Automated Bonding | |
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Flip TAB Bonding | |
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Flip-Chip Mounting | |
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Printed Circuit Board Technologies | |
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Solid Board | |
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Flexible Board | |
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Plastic Moulded | |
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Hybrid and MCM Technologies | |
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Thick Film | |
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Multichip Modules | |
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Ball Grid Array | |
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Programmable Devices And ASICs | |
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References | |
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Silicon Micromachining: Bulk | |
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Introduction | |
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Isotropic and Orientation-Dependent Wet Etching | |
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Etch-Stop Techniques | |
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Doping-Selective Etching (DSE) | |
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Conventional Bias-Dependent BSE or Electrochemical Etch-Stop | |
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Selective Etching of n-Type Silicon by Pulsed Potential Anodisation | |
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Photovoltaic Electrochemical Etch-Stop Technique (PHET) | |
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Dry Etching | |
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Buried Oxide Process | |
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Silicon Fusion Bonding | |
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Wafer Fusion | |
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Annealing Treatment | |
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Fusion of Silicon-Based Materials | |
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Anodic Bonding | |
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Concluding Remarks | |
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References | |
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Silicon Micromachining: Surface | |
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Introduction | |
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Sacrificial Layer Technology | |
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Simple Process | |
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Sacrificial Layer Processes Utilising more than One Structural Layer | |
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Material Systems in Sacrificial Layer Technology | |
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Polycrystalline Silicon and Silicon Dioxide | |
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Polyimide and Aluminum | |
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Silicon Nitride/Polycrystalline Silicon and Tungsten/Silicon Dioxide | |
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Surface Micromachining using Plasma Etching | |
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Combined IC Technology and Anisotropic Wet Etching | |
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Processes Using Both Bulk and Surface Micromachining | |
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Adhesion Problems in Surface Micromachining | |
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Surface Versus Bulk Micromachining | |
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References | |
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Microstereolithography for MEMS | |
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Introduction | |
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Photopolymerisation | |
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Stereolithographic System | |
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Microstereolithography | |
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Scanning Method | |
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Classical MSL | |
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IH Process | |
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Mass-IH Process | |
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Super-IH Process | |
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Two-photon MSL | |
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Other MSL Approaches | |
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Projection Method | |
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Mask-Projection MSL | |
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Dynamic Mask-Projection MSL | |
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Polymeric MEMS Architecture with Silicon, Metal, and Ceramics | |
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Ceramic MSL | |
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Metallic Microstructures | |
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Metal-Polymer Microstructures | |
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Localised Electrochemical Deposition | |
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Combined Silicon and Polymeric Structures | |
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Architecture Combination by Photoforming Process | |
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MSL Integrated with Thick Film Lithography | |
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AMANDA Process | |
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Applications | |
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Microactuators Fabricated by MSL | |
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Microconcentrator | |
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Microdevices Fabricated by the AMANDA Process | |
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Concluding Remarks | |
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References | |
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Microsensors | |
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Introduction | |
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Thermal Sensors | |
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Resistive Temperature Microsensors | |
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Microthermocouples | |
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Thermodiodes and Thermotransistors | |
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SAW Temperature Sensor | |
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Radiation Sensors | |
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Photoconductive Devices | |
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Photovoltaic Devices | |
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Pyroelectric Devices | |
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Microantenna | |
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Mechanical Sensors | |
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Overview | |
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Micromechanical Components and Statics | |
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Microshuttles and Dynamics | |
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Mechanical Microstructures | |
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Pressure Microsensors | |
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Microaccelerometers | |
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Microgyrometers | |
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Flow Microsensors | |
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Magnetic Sensors | |
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Magnetogalvanic Microsensors | |
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Magnetoresistive Devices | |
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Magnetodiodes and Magnetotransistors | |
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Acoustic Devices and SQUIDs | |
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Bio(chemical) Sensors | |
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Conductimetric Devices | |
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Potentiometric Devices | |
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Others | |
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Concluding Remarks | |
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References | |
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Introduction to SAW Devices | |
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Introduction | |
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Saw Device Development and History | |
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The Piezoelectric Effect | |
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Interdigital Transducers in SAW Devices | |
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Acoustic Waves | |
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Rayleigh Surface Acoustic Waves | |
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Shear Horizontal Acoustic Waves | |
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Love Surface Acoustic Waves | |
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Concluding Remarks | |
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References | |
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Surface Acoustic Waves in Solids | |
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Introduction | |
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Acoustic Wave Propagation | |
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Acoustic Wave Propagation Representation | |
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Introduction to Acoustics | |
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Particle Displacement and Strain | |
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Stress | |
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The Piezoelectric Effect | |
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Acoustic Wave Propagation | |
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Uniform Plane Waves in a Piezoelectric Solid: Quasi-Static Approximation | |
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Shear Horizontal or Acoustic Plate Modes | |
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Love Modes | |
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Concluding Remarks | |
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References | |
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IDT Microsensor Parameter Measurement | |
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Introduction to IDT SAW Sensor Instrumentation | |
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Acoustic Wave Sensor Instrumentation | |
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Introduction | |
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Network Analyser and Vector Voltmeter | |
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Analogue (Amplitude) Measuring System | |
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Phase Measurement System | |
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Frequency Measurement System | |
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Acoustic Wave Sensor Output Frequency Translation | |
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Measurement Setup | |
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Calibration | |
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References | |
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IDT Microsensor Fabrication | |
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Introduction | |
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Saw-IDT Microsensor Fabrication | |
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Mask Generation | |
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Wafer Preparation | |
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Metallisation | |
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Photolithography | |
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Wafer Dicing | |
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Deposition of Waveguide Layer | |
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Introduction | |
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TMS PECVD Process and Conditions | |
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Concluding Remarks | |
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References | |
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IDT Microsensors | |
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Introduction | |
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Saw Device Modeling via Coupled-mode Theory | |
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Wireless SAW-based Microsensors | |
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Applications | |
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Strain Sensor | |
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Temperature Sensor | |
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Pressure Sensor | |
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Humidity Sensor | |
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SAW-Based Gyroscope | |
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Concluding Remarks | |
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References | |
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MEMS-IDT Microsensors | |
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Introduction | |
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Principles of a MEMS-IDT Accelerometer | |
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Fabrication of a MEMS-IDT Accelerometer | |
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Fabrication of the SAW Device | |
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Integration of the SAW Device and Seismic Mass | |
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Testing of a MEMS-IDT Accelerometer | |
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Measurement Setup | |
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Calibration Procedure | |
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Time Domain Measurement | |
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Experimental | |
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Fabrication of Seismic Mass | |
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Wireless Readout | |
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Hybrid Accelerometers and Gyroscopes | |
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Concluding Remarks | |
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References | |
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Smart Sensors and MEMS | |
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Introduction | |
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Smart Sensors | |
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MEMS Devices | |
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Concluding Remarks | |
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References | |
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Appendices | |
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List of Abbreviations | |
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List of Symbols and Prefixes | |
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List of Some Important Terms | |
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Fundamental Constants | |
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Unit Conversion Factors | |
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Properties of Electronic and MEMS Metallic Materials | |
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Properties of Electronic and MEMS Semiconducting Materials | |
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Properties of Electronic and MEMS Ceramic and Polymer Materials | |
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Complex Reciprocity Relation and Perturbation Analysis | |
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Coupled-mode Modeling of a SAW Device | |
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Suggested Further Reading | |
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Webography | |
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List of Worked Examples | |
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Index | |