Introduction to X-Ray Powder Diffractometry

Name: Introduction to X-Ray Powder Diffractometry
Price: 164.67 USD
Availability: InStock
ISBN: 9780471513391

ISBN-10: 0471513393

ISBN-13: 9780471513391

Edition: 1st 1996

Authors: Ron Jenkins, Robert Snyder

List price: $216.95

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Reflecting the recent trend towards automation, this volume focuses on the fundamentals required to understand the theory and practice of powder diffraction, with a strong emphasis on qualitative and quantitative analysis.

Book details

List price: $216.95
Edition: 1st
Copyright year: 1996
Publisher: John Wiley & Sons, Incorporated
Publication date: 7/12/1996
Binding: Hardcover
Pages: 432
Size: 6.30" wide x 9.19" long x 1.03" tall
Weight: 1.540
Language: English

RON JENKINS teaches at the Inter-national Centre for Diffraction Data.



Characteristics of X-Radiation


The Crystalline State


Diffraction Theory


Sources for the Generation of X-Radiation


Detectors and Detection Electronics


Production of Monochromatic Radiation


Instruments for the Measurement of Powder Patterns


Alignment and Maintenance of Powder Diffractometers


Specimen Preparation


Acquisition of Diffraction Data


Reduction of Data from Automated Powder Diffractometers


Qualitative Analysis


Quantitative Analysis


Appendices


Index