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| Preface | |
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| Series Foreword | |
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| Introduction | |
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| Why test? | |
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| Causes of failure to achieve design requirements | |
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| Reliability and durability | |
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| Environments | |
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| How to test? | |
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| Test to succeed, or test to fail? | |
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| Accelerated test | |
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| Testing systems and components | |
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| Testing the technologies | |
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| Testing the processes | |
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| Analysis and simulation | |
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| Good and bad testing | |
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| Test economics | |
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| Development | |
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| Manufacture | |
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| Maintenance | |
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| Managing the test programme | |
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| Stress, Strength and Failure of Materials | |
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| Introduction | |
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| Mechanical stress and fracture | |
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| Fatigue | |
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| Creep | |
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| Vibration and shock | |
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| Temperature effects | |
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| Wear | |
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| Corrosion | |
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| Humidity and condensation | |
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| Materials and components selection | |
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| Metals | |
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| Plastics, rubbers | |
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| Fasteners | |
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| Adhesives | |
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| Welding and soldering | |
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| Seals | |
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| References | |
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| Electrical and Electronics Stress, Strength and Failure | |
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| Introduction | |
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| Stress effects | |
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| Current | |
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| Voltage | |
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| Temperature | |
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| Power | |
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| Component types and failure mechanisms | |
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| Integrated circuits (ICs) | |
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| Discrete semiconductors | |
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| 'Passive' components | |
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| Electro-optical components | |
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| Solder | |
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| Cables and connectors | |
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| Insulation | |
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| Circuit and system aspects | |
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| Distortion and jitter | |
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| Timing and interference | |
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| Intermittent failures | |
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| Other failure causes | |
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| References | |
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| Variation and Reliability | |
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| Variation in engineering | |
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| Distributed variables | |
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| Effects, causes and tails | |
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| Load-strength interference | |
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| Time-dependent variation | |
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| Multiple variations and statistical experiments | |
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| Taguchi method | |
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| Discrete variation | |
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| Confidence and significance | |
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| Reliability | |
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| Summary | |
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| References | |
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| Design Analysis | |
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| Introduction | |
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| Quality Function Deployment | |
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| Design analysis methods | |
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| Mathematical | |
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| Mechanical | |
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| Electrical/electronic | |
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| Systems, general | |
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| Monte Carlo simulation | |
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| Other system simulation methods | |
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| Analysis methods for reliability and safety | |
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| Load and strength analysis | |
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| Failure modes and effects analysis | |
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| Sneak analysis | |
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| Fault tree analysis | |
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| Hazops | |
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| Design analysis for processes | |
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| Process FMEA | |
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| 'Poka yoke' | |
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| Testability analysis | |
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| Test yield analysis | |
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| Maintainability analysis | |
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| Summary | |
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| Software for design analysis | |
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| Limitations of design analyses | |
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| Using analysis results for test planning | |
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| References | |
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| Development Testing Principles | |
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| Introduction | |
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| Functional testing | |
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| Testing for reliability and durability: accelerated test | |
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| Test approach for accelerated test | |
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| Halt and production testing | |
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| Common questions on Halt | |
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| Overall benefits of Halt and Hass | |
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| Testing for variation: Taguchi method | |
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| DoE or Halt? | |
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| Process testing | |
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| Process capability studies | |
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| 'Beta' testing | |
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| Conclusions | |
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| References | |
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| Materials and Systems Testing | |
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| Materials | |
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| Strength | |
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| Hardness | |
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| Toughness | |
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| Wear resistance | |
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| Corrosion and chemical attack | |
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| Data | |
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| Assemblies and systems | |
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| Temperature | |
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| Vibration and shock | |
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| Other conditions | |
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| Combined environments | |
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| Facilities for accelerated test | |
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| System aspects | |
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| Power and rotating machinery | |
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| Fluid systems | |
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| Humans | |
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| Large systems | |
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| Data collection and analysis | |
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| Standard test methods | |
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| Test centres | |
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| Information | |
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| References | |
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| Testing Electronics | |
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| Introduction | |
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| Circuit test principles | |
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| Analogue | |
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| Digital | |
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| Test equipment | |
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| Manual test equipment | |
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| Automatic test equipment | |
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| Test data acquisition | |
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| Design for test | |
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| Test capability | |
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| Test software | |
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| Scan design | |
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| Built-in self-test (Bist) | |
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| Electronic component test | |
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| 'Discretes' | |
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| Integrated circuits | |
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| IC design for test | |
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| EMI/EMC testing | |
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| Information | |
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| References | |
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| Software | |
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| Introduction | |
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| Software in engineering systems | |
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| Software errors | |
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| Specification errors | |
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| Software system design | |
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| Software code generation | |
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| Preventing errors | |
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| Specification | |
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| Structure and modularity | |
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| Software reuse | |
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| Programming style | |
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| Software checking | |
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| 'Formal' design and analysis methods | |
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| Fault tolerance | |
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| Redundancy/diversity | |
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| Languages | |
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| Analysis of software system design | |
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| Data reliability | |
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| Software testing | |
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| Managing software testing | |
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| Conclusions | |
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| References | |
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| Manufacturing Test | |
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| Introduction | |
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| Manufacturing test principles | |
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| Value added testing | |
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| Test capability | |
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| Test criteria | |
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| Test stresses | |
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| Manufacturing test economics | |
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| Inspection and measurement | |
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| Test methods | |
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| Mechanical and systems test | |
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| Electronics | |
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| Stress screening | |
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| Highly accelerated stress screening | |
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| Electronics manufacturing test options and economics | |
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| Circuit board test | |
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| Assembly test | |
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| Integrating stress screening | |
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| Post-production savings | |
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| Conclusions | |
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| Testing electronic components | |
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| Integrated circuits | |
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| Statistical process control and acceptance sampling | |
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| References | |
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| Testing in Service | |
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| Introduction | |
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| In-service test economics | |
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| Test schedules | |
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| Mechanical and systems | |
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| Electronic and electrical | |
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| Built-in test | |
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| 'No fault found' | |
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| Software | |
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| Reliability centred maintenance | |
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| Stress screening of repaired items | |
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| Calibration | |
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| References | |
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| Data Collection and Analysis | |
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| Introduction | |
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| Failure reporting, analysis and corrective action system (FRACAS) | |
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| Procedure for FRACAS | |
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| Failure reporting forms | |
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| Failure data analysis: the 'seven tools' | |
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| Acceptance sampling | |
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| Probability and hazard plotting | |
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| Time series analysis | |
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| Software for data collection and analysis | |
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| Reliability demonstration and growth measurement | |
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| Reliability demonstration | |
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| Reliability growth monitoring | |
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| General comments on data analysis | |
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| Sources of data | |
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| References | |
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| Laws, Regulations and Standards | |
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| Introduction | |
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| Laws and regulations | |
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| Safety and product liability | |
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| Main regulatory agencies | |
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| USA | |
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| Europe | |
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| Standards | |
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| International standards | |
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| NATO standards | |
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| USA | |
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| Europe | |
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| UK | |
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| Other countries | |
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| 'Generic' standards | |
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| ISO9000 (Quality Systems) | |
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| ISO/IEC60300 ('Dependability') | |
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| ISO/IEC61508 (Functional Safety of Electrical/Electronic/Programmable Electronic Safety-related Systems) | |
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| Industry/technology standards | |
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| Aviation and aerospace | |
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| Automotive | |
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| Other industries | |
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| Conclusions | |
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| References | |
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| Management | |
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| Introduction | |
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| Organisation and responsibilities | |
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| Test Department | |
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| Design | |
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| Procedures for test | |
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| The development test programme | |
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| What to test? | |
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| How many to test? | |
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| System levels for test | |
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| Testing purchased items | |
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| Hardware allocations to test | |
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| Test methods | |
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| Development test economics | |
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| Use of external test facilities | |
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| Regulations and standards | |
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| The project test plan | |
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| Manufacturing and maintenance | |
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| Training and education for test | |
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| The future of test | |
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| Virtual testing | |
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| Intelligent CAE | |
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| The Internet | |
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| Test hardware | |
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| Teaching testing | |
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| Conclusions | |
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| References | |
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| Appendices | |
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| Acronyms | |
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| Testing regulations and standards | |
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| Development test plan example | |
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| Production test plan example | |
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| Index | |