Test Engineering A Concise Guide to Cost-Effective Design, Development and Manufacture

ISBN-10: 0471498823

ISBN-13: 9780471498827

Edition: 2001

List price: $118.00 Buy it from $116.79
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Description: This reference resource serves as a tool to facilitate development engineers to develop new testing methodologies appropriate for new technological products as they evolve.

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Book details

List price: $118.00
Copyright year: 2001
Publisher: John Wiley & Sons, Incorporated
Publication date: 6/22/2001
Binding: Hardcover
Pages: 288
Size: 6.73" wide x 10.00" long x 0.82" tall
Weight: 0.638
Language: English

Preface
Series Foreword
Introduction
Why test?
Causes of failure to achieve design requirements
Reliability and durability
Environments
How to test?
Test to succeed, or test to fail?
Accelerated test
Testing systems and components
Testing the technologies
Testing the processes
Analysis and simulation
Good and bad testing
Test economics
Development
Manufacture
Maintenance
Managing the test programme
Stress, Strength and Failure of Materials
Introduction
Mechanical stress and fracture
Fatigue
Creep
Vibration and shock
Temperature effects
Wear
Corrosion
Humidity and condensation
Materials and components selection
Metals
Plastics, rubbers
Fasteners
Adhesives
Welding and soldering
Seals
References
Electrical and Electronics Stress, Strength and Failure
Introduction
Stress effects
Current
Voltage
Temperature
Power
Component types and failure mechanisms
Integrated circuits (ICs)
Discrete semiconductors
'Passive' components
Electro-optical components
Solder
Cables and connectors
Insulation
Circuit and system aspects
Distortion and jitter
Timing and interference
Intermittent failures
Other failure causes
References
Variation and Reliability
Variation in engineering
Distributed variables
Effects, causes and tails
Load-strength interference
Time-dependent variation
Multiple variations and statistical experiments
Taguchi method
Discrete variation
Confidence and significance
Reliability
Summary
References
Design Analysis
Introduction
Quality Function Deployment
Design analysis methods
Mathematical
Mechanical
Electrical/electronic
Systems, general
Monte Carlo simulation
Other system simulation methods
Analysis methods for reliability and safety
Load and strength analysis
Failure modes and effects analysis
Sneak analysis
Fault tree analysis
Hazops
Design analysis for processes
Process FMEA
'Poka yoke'
Testability analysis
Test yield analysis
Maintainability analysis
Summary
Software for design analysis
Limitations of design analyses
Using analysis results for test planning
References
Development Testing Principles
Introduction
Functional testing
Testing for reliability and durability: accelerated test
Test approach for accelerated test
Halt and production testing
Common questions on Halt
Overall benefits of Halt and Hass
Testing for variation: Taguchi method
DoE or Halt?
Process testing
Process capability studies
'Beta' testing
Conclusions
References
Materials and Systems Testing
Materials
Strength
Hardness
Toughness
Wear resistance
Corrosion and chemical attack
Data
Assemblies and systems
Temperature
Vibration and shock
Other conditions
Combined environments
Facilities for accelerated test
System aspects
Power and rotating machinery
Fluid systems
Humans
Large systems
Data collection and analysis
Standard test methods
Test centres
Information
References
Testing Electronics
Introduction
Circuit test principles
Analogue
Digital
Test equipment
Manual test equipment
Automatic test equipment
Test data acquisition
Design for test
Test capability
Test software
Scan design
Built-in self-test (Bist)
Electronic component test
'Discretes'
Integrated circuits
IC design for test
EMI/EMC testing
Information
References
Software
Introduction
Software in engineering systems
Software errors
Specification errors
Software system design
Software code generation
Preventing errors
Specification
Structure and modularity
Software reuse
Programming style
Software checking
'Formal' design and analysis methods
Fault tolerance
Redundancy/diversity
Languages
Analysis of software system design
Data reliability
Software testing
Managing software testing
Conclusions
References
Manufacturing Test
Introduction
Manufacturing test principles
Value added testing
Test capability
Test criteria
Test stresses
Manufacturing test economics
Inspection and measurement
Test methods
Mechanical and systems test
Electronics
Stress screening
Highly accelerated stress screening
Electronics manufacturing test options and economics
Circuit board test
Assembly test
Integrating stress screening
Post-production savings
Conclusions
Testing electronic components
Integrated circuits
Statistical process control and acceptance sampling
References
Testing in Service
Introduction
In-service test economics
Test schedules
Mechanical and systems
Electronic and electrical
Built-in test
'No fault found'
Software
Reliability centred maintenance
Stress screening of repaired items
Calibration
References
Data Collection and Analysis
Introduction
Failure reporting, analysis and corrective action system (FRACAS)
Procedure for FRACAS
Failure reporting forms
Failure data analysis: the 'seven tools'
Acceptance sampling
Probability and hazard plotting
Time series analysis
Software for data collection and analysis
Reliability demonstration and growth measurement
Reliability demonstration
Reliability growth monitoring
General comments on data analysis
Sources of data
References
Laws, Regulations and Standards
Introduction
Laws and regulations
Safety and product liability
Main regulatory agencies
USA
Europe
Standards
International standards
NATO standards
USA
Europe
UK
Other countries
'Generic' standards
ISO9000 (Quality Systems)
ISO/IEC60300 ('Dependability')
ISO/IEC61508 (Functional Safety of Electrical/Electronic/Programmable Electronic Safety-related Systems)
Industry/technology standards
Aviation and aerospace
Automotive
Other industries
Conclusions
References
Management
Introduction
Organisation and responsibilities
Test Department
Design
Procedures for test
The development test programme
What to test?
How many to test?
System levels for test
Testing purchased items
Hardware allocations to test
Test methods
Development test economics
Use of external test facilities
Regulations and standards
The project test plan
Manufacturing and maintenance
Training and education for test
The future of test
Virtual testing
Intelligent CAE
The Internet
Test hardware
Teaching testing
Conclusions
References
Appendices
Acronyms
Testing regulations and standards
Development test plan example
Production test plan example
Index
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