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| Preface to the Third Edition | |
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| Newton, Fizeau, and Haidinger Interferometers | |
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| Introduction | |
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| Newton Interferometer | |
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| Source and Observer''s Pupil Size Considerations | |
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| Some Suitable Light Sources | |
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| Materials for the Optical Flats | |
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| Simple Procedure for Estimating Peak Error | |
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| Measurement of Spherical Surfaces | |
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| Measurement of Aspheric Surfaces | |
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| Measurement of Flatness of Opaque Surfaces | |
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| Fizeau Interferometer | |
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| The Basic Fizeau Interferometer | |
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| Coherence Requirements for the Light Source | |
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| Quality of Collimation Lens Required | |
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| Liquid Reference Flats | |
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| Fizeau Interferometer with Laser Source | |
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| Multiple-Beam Fizeau Setup | |
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| Testing Nearly Parallel Plates | |
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| Testing the Inhomogeneity of Large Glass or Fused Quartz Samples | |
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| Testing the Parallelism and Flatness of the Faces of Rods, Bars and Plates | |
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| Testing Cube Corner and Right-Angle Prisms | |
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| Fizeau Interferometer for Curved Surfaces | |
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| Testing Concave and Convex Surfaces | |
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| Haidinger Interferometer | |
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| Applications of Haidinger Fringes | |
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| Use of Laser Source for Haidinger Interferometer | |
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| Other Applications of Haidinger Fringes | |
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| Absolute Testing of Flats | |
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| Twyman-Green Interferometer | |
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| Introduction | |
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| Beam-Splitter | |
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| Optical Path Difference Introduced by the Beam Splitter Plate | |
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| Required Accuracy in the Beam Splitter Plate | |
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| Cube Beam Splitter | |
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| Coherence Requirements | |
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| Spatial Coherence | |
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| Temporal Coherence | |
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| Uses of a Twyman-Green Interferometer | |
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| Testing of Prisms and Diffraction Rulings | |
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| Testing of Lenses | |
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| Testing of Microscope Objectives | |
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| Compensation of Intrinsic Aberrations in the Interferometer | |
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| Unequal-Path Interferometer | |
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| Some Special Designs | |
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| Improving the Fringe Stability | |
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| Open Path Interferometers | |
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| Mach-Zehnder Interferometers | |
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| Triangular Interferometers | |
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| Oblique Incidence Interferometers | |
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| Variations from the Twyman-Green Configuration | |
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| Interferometers with Diffractive Beam Splitters | |
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| Phase Conjugating Interferometer | |
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| Typical Interferograms and their Analysis | |
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| Analysis of Interferograms of Arbitrary Wavefronts | |
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| Common-Path Interferometers | |
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| Introduction | |
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| Burch''s Interferometer Employing Two Matched Scatter Plates | |
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| Fresnel Zone Plate Interferometer | |
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| Burch and Fresnel Zone Plate Interferometer for Aspheric Surfaces | |
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| Burch and fresnel Zone Plate Interferometers for Phase Shifting | |
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| Birefringent Beam Splitters | |
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| Savart Polariscope | |
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| Wollaston Prism | |
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| Double-Focus Systems | |
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| Lateral Shearing Interferometers | |
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| Use of a Savart Polariscope | |
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| Use of a Wollaston Prism | |
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| Double-Focus Interferometer | |
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| Saunders''s Prism Interferometer | |
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| Point Diffraction Interferometer | |
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| Zernike Tests with Common-Path Interferometers | |
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| Measurement of the Optical Transfer Function | |
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| Lateral Shear Interferometers | |
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| Introduction | |
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| Coherence Properties of the Light Source | |
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| Brief Theory of Lateral Shearing Interferometry | |
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| Interferograms of Spherical and Flat Wavefronts | |
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| Interferogams of Primary Aberrations upon Lateral Shear | |
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| Evaluation of an Unknown Wavefront | |
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| Lateral Shearing Interferometers in Collimated Light (White Light Compensated) | |
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| Arrangements Based on the Jamin Interferometer | |
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| Arrangements Based on the Michelson Interferometer | |
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| Arrangements Based on a Cyclic Interferometer | |
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| Arrangements Based on the Mach-Zehnder Interferometer | |
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| Lateral Shearing Interferometers in Convergent Light (White-light Compensated) | |
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| Arrangements Based on the Michelson Interferometer | |
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| Arrangements Based on the Mach-Zehnder Interferometer | |
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| Lateral Shearing Interferometers Using Lasers | |
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