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| Preface to the Second Edition | |
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| Preface to the First Edition | |
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| The Concept of Microstructure | |
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| Microstructural Features | |
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| Struture-Property Relationships | |
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| Microstructural Scale | |
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| Microstructural Parameters | |
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| Crystallography and Crystal Structure | |
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| Interatomic Bonding in Solids | |
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| Crystalline and Amorphous Phases | |
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| The Crystal Lattice | |
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| Summary | |
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| Bibliography | |
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| Worked Examples | |
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| Problems | |
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| Diffraction Analysis of Crystal Structure | |
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| Scattering of Radiation by Crystals | |
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| The Laue Equations and Bragg's Law | |
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| Allowed and Forbidden Reflections | |
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| Reciprocal Space | |
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| The Limiting Sphere Construction | |
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| Vector Representation of Bragg's Law | |
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| The Reciprocal Lattice | |
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| X-Ray Diffraction Methods | |
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| The X-Ray Diffractometer | |
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| Powder Diffraction-Particles and Polycrystals | |
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| Single Crystal Laue Diffraction | |
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| Rotating Single Crystal Methods | |
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| Diffraction Analysis | |
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| Atomic Scattering Factors | |
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| Scattering by the Unit Cell | |
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| The Structure Factor in the Complex Plane | |
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| Interpretation of Diffracted Intensities | |
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| Errors and Assumptions | |
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| Electron Diffraction | |
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| Wave Properties of Electrons | |
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| Ring Patterns, Spot Patterns and Laue Zones | |
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| Kikuchi Patterns and Their Interpretation | |
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| Summary | |
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| Bibliography | |
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| Worked Examples | |
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| Problems | |
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| Optical Microscopy | |
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| Geometrical Optics | |
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| Optical Image Formation | |
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| Resolution in the Optical Microscope | |
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| Depth of Field and Depth of Focus | |
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| Construction of The Microscope | |
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| Light Sources and Condenser Systems | |
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| The Specimen Stage | |
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| Selection of Objective Lenses | |
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| Image Observation and Recording | |
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| Specimen Preparation | |
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| Sampling and Sectioning | |
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| Mounting and Grinding | |
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| Polishing and Etching Methods | |
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| Image Contrast | |
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| Reflection and Absorption of Light | |
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| Bright-Field and Dark-Field Image Contrast | |
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| Confocal Microscopy | |
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| Interference Contrast and Interference Microscopy | |
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| Optical Anisotropy and Polarized Light | |
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| Phase Contrast Microscopy | |
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| Working with Digital Images | |
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| Data Collection and The Optical System | |
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| Data Processing and Analysis | |
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| Data Storage and Presentation | |
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| Dynamic Range and Digital Storage | |
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| Resolution, Contrast and Image Interpretation | |
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| Summary | |
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| Bibliography | |
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| Worked Examples | |
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| Problems | |
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| Transmission Electron Microscopy | |
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| Basic Principles | |
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| Wave Properties of Electrons | |
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| Resolution Limitations and Lens Aberrations | |
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| Comparative Performance of Transmission and Scanning Electron Microscopy | |
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| Specimen Preparation | |
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| Mechanical Thinning | |
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| Electrochemical Thinning | |
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| Ion Milling | |
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| Sputter Coating and Carbon Coating | |
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| Replica Methods | |
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| The Origin of Contrast | |
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| Mass-Thickness Contrast | |
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| Diffraction Contrast and Crystal Lattice Defects | |
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| Phase Contrast and Lattice Imaging | |
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| Kinematic Interpretation of Diffraction Contrast | |
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| Kinematic Theory of Electron Diffraction | |
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| The Amplitude-Phase Diagram | |
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| Contrast From Lattice Defects | |
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| Stacking Faults and Anti-Phase Boundaries | |
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| Edge and Screw Dislocations | |
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| Point Dilatations and Coherency Strains | |
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| Dynamic Diffraction and Absorption Effects | |
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| Stacking Faults Revisited | |
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| Quantitative Analysis of Contrast | |
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| Lattice Imaging at High Resolution | |
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| The Lattice Image and the Contrast Transfer Function | |
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| Computer Simulation of Lattice Images | |
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| Lattice Image Interpretation | |
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| Scanning Transmission Electron Microscopy | |
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| Summary | |
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| Bibliography | |
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| Worked Examples | |
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| Problems | |
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| Scanning Electron Microscopy | |
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| Components of The Scanning Electron Microscope | |
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| Electron Beam-Specimen Interactions | |
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| Beam-Focusing Conditions | |
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| Inelastic Scattering and Energy Losses | |
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| Electron Excitation of X-Rays | |
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| Characteristic X-Ray Images | |
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| Backscattered Electrons | |
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| Image Contrast in Backscattered Electron Images | |
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| Secondary Electron Emission | |
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| Factors Affecting Secondary Electron Emission | |
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| Secondary Electron Image Contrast | |
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| Alternative Imaging Modes | |
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| Cathodoluminescence | |
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| Electron Beam Induced Current | |
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| Orientation Imaging Microscopy | |
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| Electron Backscattered Diffraction Patterns | |
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| OIM Resolution and Sensitivity | |
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| Localized Preferred Orientation and Residual Stress | |
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| Specimen Preparation and Topology | |
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| Sputter Coating and Contrast Enhancement | |
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| Fractography and Failure Analysis | |
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| Stereoscopic Imaging | |
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| Parallax Measurements | |
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| Focused Ion Beam Microscopy | |
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| Principles of Operation and Microscope Construction | |
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| Ion Beam-Specimen Interactions | |
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| Dual-Beam FIB Systems | |
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| Machining and Deposition | |
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| TEM Specimen Preparation | |
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| Serial Sectioning | |
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| Summary | |
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| Bibliography | |
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| Worked Examples | |
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| Problems | |
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| Microanalysis in Electron Microscopy | |
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| X-Ray Microanalysis | |
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| Excitation of Characteristic X-Rays | |
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| Detection of Characteristic X-Rays | |
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| Quantitative Analysis of Composition | |
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| Electron Energy Loss Spectroscopy | |
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| The Electron Energy-Loss Spectrum | |
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| Limits of Detection and Resolution in EELS | |
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| Quantitative Electron Energy Loss Analysis | |
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| Near-Edge Fine Structure Information | |
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| Far-Edge Fine Structure Information | |
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| Energy-Filtered Transmission Electron Microscopy | |
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| Summary | |
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| Bibliography | |
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| Worked Examples | |
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| Problems | |
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| Scanning Probe Microscopy and Related Techniques | |
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| Surface Forces and Surface Morphology | |
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| Surface Forces and Their Origin | |
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| Surface Force Measurements | |
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| Surface Morphology: Atomic and Lattice Resolution | |
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| Scanning Probe Microscopes | |
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| Atomic Force Microscopy | |
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| Scanning Tunnelling Microscopy | |
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| Field-Ion Microscopy and Atom Probe Tomography | |
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| Identifying Atoms by Field Evaporation | |
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| The Atom Probe and Atom Probe Tomography | |
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| Summary | |
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| Bibliography | |
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| Problems | |
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| Chemical Analysis of Surface Composition | |
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| X-Ray Photoelectron Spectroscopy | |
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| Depth Discrimination | |
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| Chemical Binding States | |
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| Instrumental Requirements | |
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| Applications | |
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| Auger Electron Spectroscopy | |
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| Spatial Resolution and Depth Discrimination | |
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| Recording and Presentation of Spectra | |
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| Identification of Chemical Binding States | |
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| Quantitative Auger Analysis | |
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| Depth Profiling | |
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| Auger Imaging | |
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| Secondary-Ion Mass Spectrometry | |
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| Sensitivity and Resolution | |
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| Calibration and Quantitative Analysis | |
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| SIMS Imaging | |
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| Summary | |
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| Bibliography | |
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| Worked Examples | |
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| Problems | |
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| Quantitative and Tomographic Analysis of Microstructure | |
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| Basic Stereological Concepts | |
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| Isotropy and Anisotropy | |
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| Homogeneity and Inhomogeneity | |
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| Sampling and Sectioning | |
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| Statistics and Probability | |
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| Accessible and Inaccessible Parameters | |
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| Accessible Parameters | |
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| Inaccessible Parameters | |
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| Optimizing Accuracy | |
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| Sample Size and Counting Time | |
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| Resolution and Detection Errors | |
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| Sample Thickness Corrections | |
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| Observer Bias | |
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| Dislocation Density Revisited | |
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| Automated Image Analysis | |
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| Digital Image Recording | |
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| Statistical Significance and Microstructural Relevance | |
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| Tomography and Three-Dimensional Reconstruction | |
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| Presentation of Tomographic Data | |
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| Methods of Serial Sectioning | |
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| Three-Dimensional Reconstruction | |
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| Summary | |
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| Bibliography | |
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| Worked Examples | |
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| Problems | |
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| Appendices | |
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| Useful Equations | |
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| Interplanar Spacings | |
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| Unit Cell Volumes | |
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| Interplanar Angles | |
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| Direction Perpendicular to a Crystal Plane | |
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| Hexagonal Unit Cells | |
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| The Zone Axis of Two Planes in the Hexagonal System | |
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| Wavelengths | |
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| Relativistic Electron Wavelengths | |
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| X-Ray Wavelengths for Typical X-Ray Sources | |
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| Index | |