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Preface to the Second Edition | |
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Preface to the First Edition | |
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The Concept of Microstructure | |
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Microstructural Features | |
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Struture-Property Relationships | |
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Microstructural Scale | |
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Microstructural Parameters | |
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Crystallography and Crystal Structure | |
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Interatomic Bonding in Solids | |
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Crystalline and Amorphous Phases | |
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The Crystal Lattice | |
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Summary | |
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Bibliography | |
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Worked Examples | |
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Problems | |
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Diffraction Analysis of Crystal Structure | |
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Scattering of Radiation by Crystals | |
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The Laue Equations and Bragg's Law | |
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Allowed and Forbidden Reflections | |
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Reciprocal Space | |
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The Limiting Sphere Construction | |
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Vector Representation of Bragg's Law | |
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The Reciprocal Lattice | |
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X-Ray Diffraction Methods | |
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The X-Ray Diffractometer | |
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Powder Diffraction-Particles and Polycrystals | |
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Single Crystal Laue Diffraction | |
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Rotating Single Crystal Methods | |
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Diffraction Analysis | |
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Atomic Scattering Factors | |
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Scattering by the Unit Cell | |
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The Structure Factor in the Complex Plane | |
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Interpretation of Diffracted Intensities | |
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Errors and Assumptions | |
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Electron Diffraction | |
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Wave Properties of Electrons | |
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Ring Patterns, Spot Patterns and Laue Zones | |
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Kikuchi Patterns and Their Interpretation | |
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Summary | |
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Bibliography | |
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Worked Examples | |
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Problems | |
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Optical Microscopy | |
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Geometrical Optics | |
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Optical Image Formation | |
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Resolution in the Optical Microscope | |
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Depth of Field and Depth of Focus | |
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Construction of The Microscope | |
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Light Sources and Condenser Systems | |
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The Specimen Stage | |
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Selection of Objective Lenses | |
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Image Observation and Recording | |
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Specimen Preparation | |
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Sampling and Sectioning | |
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Mounting and Grinding | |
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Polishing and Etching Methods | |
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Image Contrast | |
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Reflection and Absorption of Light | |
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Bright-Field and Dark-Field Image Contrast | |
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Confocal Microscopy | |
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Interference Contrast and Interference Microscopy | |
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Optical Anisotropy and Polarized Light | |
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Phase Contrast Microscopy | |
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Working with Digital Images | |
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Data Collection and The Optical System | |
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Data Processing and Analysis | |
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Data Storage and Presentation | |
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Dynamic Range and Digital Storage | |
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Resolution, Contrast and Image Interpretation | |
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Summary | |
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Bibliography | |
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Worked Examples | |
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Problems | |
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Transmission Electron Microscopy | |
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Basic Principles | |
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Wave Properties of Electrons | |
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Resolution Limitations and Lens Aberrations | |
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Comparative Performance of Transmission and Scanning Electron Microscopy | |
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Specimen Preparation | |
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Mechanical Thinning | |
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Electrochemical Thinning | |
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Ion Milling | |
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Sputter Coating and Carbon Coating | |
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Replica Methods | |
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The Origin of Contrast | |
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Mass-Thickness Contrast | |
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Diffraction Contrast and Crystal Lattice Defects | |
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Phase Contrast and Lattice Imaging | |
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Kinematic Interpretation of Diffraction Contrast | |
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Kinematic Theory of Electron Diffraction | |
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The Amplitude-Phase Diagram | |
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Contrast From Lattice Defects | |
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Stacking Faults and Anti-Phase Boundaries | |
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Edge and Screw Dislocations | |
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Point Dilatations and Coherency Strains | |
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Dynamic Diffraction and Absorption Effects | |
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Stacking Faults Revisited | |
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Quantitative Analysis of Contrast | |
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Lattice Imaging at High Resolution | |
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The Lattice Image and the Contrast Transfer Function | |
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Computer Simulation of Lattice Images | |
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Lattice Image Interpretation | |
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Scanning Transmission Electron Microscopy | |
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Summary | |
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Bibliography | |
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Worked Examples | |
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Problems | |
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Scanning Electron Microscopy | |
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Components of The Scanning Electron Microscope | |
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Electron Beam-Specimen Interactions | |
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Beam-Focusing Conditions | |
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Inelastic Scattering and Energy Losses | |
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Electron Excitation of X-Rays | |
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Characteristic X-Ray Images | |
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Backscattered Electrons | |
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Image Contrast in Backscattered Electron Images | |
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Secondary Electron Emission | |
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Factors Affecting Secondary Electron Emission | |
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Secondary Electron Image Contrast | |
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Alternative Imaging Modes | |
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Cathodoluminescence | |
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Electron Beam Induced Current | |
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Orientation Imaging Microscopy | |
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Electron Backscattered Diffraction Patterns | |
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OIM Resolution and Sensitivity | |
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Localized Preferred Orientation and Residual Stress | |
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Specimen Preparation and Topology | |
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Sputter Coating and Contrast Enhancement | |
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Fractography and Failure Analysis | |
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Stereoscopic Imaging | |
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Parallax Measurements | |
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Focused Ion Beam Microscopy | |
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Principles of Operation and Microscope Construction | |
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Ion Beam-Specimen Interactions | |
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Dual-Beam FIB Systems | |
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Machining and Deposition | |
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TEM Specimen Preparation | |
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Serial Sectioning | |
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Summary | |
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Bibliography | |
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Worked Examples | |
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Problems | |
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Microanalysis in Electron Microscopy | |
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X-Ray Microanalysis | |
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Excitation of Characteristic X-Rays | |
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Detection of Characteristic X-Rays | |
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Quantitative Analysis of Composition | |
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Electron Energy Loss Spectroscopy | |
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The Electron Energy-Loss Spectrum | |
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Limits of Detection and Resolution in EELS | |
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Quantitative Electron Energy Loss Analysis | |
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Near-Edge Fine Structure Information | |
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Far-Edge Fine Structure Information | |
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Energy-Filtered Transmission Electron Microscopy | |
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Summary | |
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Bibliography | |
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Worked Examples | |
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Problems | |
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Scanning Probe Microscopy and Related Techniques | |
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Surface Forces and Surface Morphology | |
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Surface Forces and Their Origin | |
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Surface Force Measurements | |
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Surface Morphology: Atomic and Lattice Resolution | |
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Scanning Probe Microscopes | |
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Atomic Force Microscopy | |
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Scanning Tunnelling Microscopy | |
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Field-Ion Microscopy and Atom Probe Tomography | |
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Identifying Atoms by Field Evaporation | |
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The Atom Probe and Atom Probe Tomography | |
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Summary | |
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Bibliography | |
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Problems | |
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Chemical Analysis of Surface Composition | |
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X-Ray Photoelectron Spectroscopy | |
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Depth Discrimination | |
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Chemical Binding States | |
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Instrumental Requirements | |
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Applications | |
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Auger Electron Spectroscopy | |
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Spatial Resolution and Depth Discrimination | |
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Recording and Presentation of Spectra | |
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Identification of Chemical Binding States | |
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Quantitative Auger Analysis | |
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Depth Profiling | |
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Auger Imaging | |
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Secondary-Ion Mass Spectrometry | |
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Sensitivity and Resolution | |
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Calibration and Quantitative Analysis | |
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SIMS Imaging | |
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Summary | |
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Bibliography | |
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Worked Examples | |
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Problems | |
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Quantitative and Tomographic Analysis of Microstructure | |
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Basic Stereological Concepts | |
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Isotropy and Anisotropy | |
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Homogeneity and Inhomogeneity | |
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Sampling and Sectioning | |
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Statistics and Probability | |
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Accessible and Inaccessible Parameters | |
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Accessible Parameters | |
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Inaccessible Parameters | |
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Optimizing Accuracy | |
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Sample Size and Counting Time | |
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Resolution and Detection Errors | |
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Sample Thickness Corrections | |
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Observer Bias | |
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Dislocation Density Revisited | |
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Automated Image Analysis | |
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Digital Image Recording | |
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Statistical Significance and Microstructural Relevance | |
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Tomography and Three-Dimensional Reconstruction | |
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Presentation of Tomographic Data | |
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Methods of Serial Sectioning | |
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Three-Dimensional Reconstruction | |
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Summary | |
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Bibliography | |
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Worked Examples | |
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Problems | |
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Appendices | |
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Useful Equations | |
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Interplanar Spacings | |
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Unit Cell Volumes | |
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Interplanar Angles | |
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Direction Perpendicular to a Crystal Plane | |
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Hexagonal Unit Cells | |
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The Zone Axis of Two Planes in the Hexagonal System | |
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Wavelengths | |
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Relativistic Electron Wavelengths | |
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X-Ray Wavelengths for Typical X-Ray Sources | |
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Index | |