Introduction to Mixed-Signal IC Test and Measurement

ISBN-10: 0199796211

ISBN-13: 9780199796212

Edition: 2nd

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Description: With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topicswill help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples,exercises and problems.

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Book details

List price: $246.95
Edition: 2nd
Publisher: Oxford University Press
Publication date: 11/3/2011
Binding: Hardcover
Pages: 976
Size: 7.75" wide x 9.50" long x 1.50" tall
Weight: 3.256
Language: English

Gordon Roberts is a professor in the Department of Electrical and Computer Engineering at McGill University. He has conducted extensive research on analog integrated circuit design and mixed-signal test issues. He has published numerous papers at IEEE conferences, coauthored several textbooks related to mixed-signal test and analog integrated circuit design (including SPICE, 2e with Adel Sedra, OUP, 1996), and contributed various specialized volumes to other books. Mark Burns is a former TI fellow at Texas Instruments and an accomplished expert in mixed-signal IC test and measurement area. Friedrich Taenzler is currently an RF-Engineering Manager at Texas Instruments and is a major contributor in the field of RF testing and design.

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