Directo al Grano A Complete Reference Manual for Spanish Grammar

ISBN-10: 0130848018
ISBN-13: 9780130848017
Edition: 2000
List price: $50.20 Buy it from $1.97
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Description: For undergraduate courses in Elementary, Intermediate, and Advanced Spanish, including those focusing on grammar and composition. An indispensable grammar reference book for life, this complete, student-friendly and totally self-learning guide for  More...

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Book details

List price: $50.20
Copyright year: 2000
Publisher: Prentice Hall PTR
Publication date: 11/19/1999
Binding: Paperback
Pages: 154
Size: 8.00" wide x 10.00" long x 0.50" tall
Weight: 0.638

For undergraduate courses in Elementary, Intermediate, and Advanced Spanish, including those focusing on grammar and composition. An indispensable grammar reference book for life, this complete, student-friendly and totally self-learning guide for beginner as well as advanced students of Spanish offers a succinct, clear, and easy-to-consult format. Directo al grano answers all questions about the use of the Spanish language through concise, accurate and informative descriptions which cover all the complexity of specific grammatical points, as well as conjugated verbs. Saving students significant time when writing papers or reviewing for tests, helping to avoid persistent classroom interruptions, and greatly improving the teaching/learning experience, it presents each subject in only one chaptermaking it easy to find any answer. This text also provides a series of charts and formulas that assure mastery of the language in the clearest, fastest, and most effortless way possible.

Preface
Acknowledgments
Introduction
Test and Design-for-Test Fundamentals
Introduction to Test and DFT Fundamentals
Purpose
Introduction to Test, the Test Process, and Design-for-Test
Concurrent Test Engineering
The Reasons for Testing
Why Test? Why Add Test Logic? Pro and Con Perceptions of DFT
The Definition of Testing
What Is Testing? Stimulus
Response
Test Measurement Criteria
What Is Measured? Fault Metric Mathematics
Fault Modeling
Physical Defects
Fault Modeling
Types of Testing
Functional Testing
Structural Testing
Combinational Exhaustive and Pseudo-Exhaustive Testing
Full Exhaustive Testing
Test Styles
Manufacturing Test
The Manufacturing Test Process
Manufacturing Test Load Board
Manufacturing Test Program
Using Automatic Test Equipment
Automatic Test Equipment
ATE Limitations
ATE Cost Considerations
Test and Pin Timing
Tester and Device Pin Timing
Tester Edge Sets
Tester Precision and Accuracy
Manufacturing Test Program Components
The Pieces and Parts of a Test Program
Test Program Optimization
Recommended Reading
Automatic Test Pattern Generation Fundamentals
Introduction to Automatic Test Pattern Generation
Purpose
Introduction to Automated Test Pattern Generation
The Vector Generation Process Flow
The Reasons for ATPG
Why ATPG? Pro and Con Perceptions of ATPG
The Automatic Test Pattern Generation Process
Introduction to ATPG
Introducing the Combinational Stuck-At Fault
Combinational Stuck-At Faults
Combinational Stuck-At Fault Detection
Introducing the Delay Fault
Delay Faults
Delay Fault Detection
Introducing the Current-Based Fault
Current-Based Testing
Current-Based Testing Detection
Testability and Fault Analysis Methods
Why Conduct ATPG Analysis or Testability Analysis? What Types of Testability Analysis Are Available? Fault Effective Circuits
Controllability-Observability Analysis
Circuit Learning
Fault Masking
Causes and Effects of Fault Masking
Fault Masking on Various Fault Models
Stuck Fault Equivalence
Fault Equivalence Optimization
Fault Equivalence Side Effects
Stuck-At ATPG
Fault Selection
Exercising the Fault
Detect Path Sensit

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