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| Preface | |
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| Acknowledgments | |
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| Introduction | |
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| Test and Design-for-Test Fundamentals | |
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| Introduction to Test and DFT Fundamentals | |
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| Purpose | |
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| Introduction to Test, the Test Process, and Design-for-Test | |
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| Concurrent Test Engineering | |
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| The Reasons for Testing | |
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| Why Test? Why Add Test Logic? Pro and Con Perceptions of DFT | |
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| The Definition of Testing | |
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| What Is Testing? Stimulus | |
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| Response | |
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| Test Measurement Criteria | |
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| What Is Measured? Fault Metric Mathematics | |
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| Fault Modeling | |
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| Physical Defects | |
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| Fault Modeling | |
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| Types of Testing | |
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| Functional Testing | |
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| Structural Testing | |
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| Combinational Exhaustive and Pseudo-Exhaustive Testing | |
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| Full Exhaustive Testing | |
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| Test Styles | |
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| Manufacturing Test | |
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| The Manufacturing Test Process | |
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| Manufacturing Test Load Board | |
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| Manufacturing Test Program | |
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| Using Automatic Test Equipment | |
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| Automatic Test Equipment | |
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| ATE Limitations | |
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| ATE Cost Considerations | |
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| Test and Pin Timing | |
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| Tester and Device Pin Timing | |
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| Tester Edge Sets | |
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| Tester Precision and Accuracy | |
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| Manufacturing Test Program Components | |
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| The Pieces and Parts of a Test Program | |
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| Test Program Optimization | |
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| Recommended Reading | |
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| Automatic Test Pattern Generation Fundamentals | |
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| Introduction to Automatic Test Pattern Generation | |
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| Purpose | |
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| Introduction to Automated Test Pattern Generation | |
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| The Vector Generation Process Flow | |
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| The Reasons for ATPG | |
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| Why ATPG? Pro and Con Perceptions of ATPG | |
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| The Automatic Test Pattern Generation Process | |
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| Introduction to ATPG | |
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| Introducing the Combinational Stuck-At Fault | |
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| Combinational Stuck-At Faults | |
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| Combinational Stuck-At Fault Detection | |
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| Introducing the Delay Fault | |
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| Delay Faults | |
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| Delay Fault Detection | |
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| Introducing the Current-Based Fault | |
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| Current-Based Testing | |
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| Current-Based Testing Detection | |
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| Testability and Fault Analysis Methods | |
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| Why Conduct ATPG Analysis or Testability Analysis? What Types of Testability Analysis Are Available? Fault Effective Circuits | |
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| Controllability-Observability Analysis | |
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| Circuit Learning | |
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| Fault Masking | |
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| Causes and Effects of Fault Masking | |
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| Fault Masking on Various Fault Models | |
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| Stuck Fault Equivalence | |
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| Fault Equivalence Optimization | |
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| Fault Equivalence Side Effects | |
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| Stuck-At ATPG | |
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| Fault Selection | |
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| Exercising the Fault | |
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| Detect Path Sensit | |