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    Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

    ISBN-10: 1461443369
    ISBN-13: 9781461443360
    Author(s): Osamu Ueda, Stephen J. Pearton
    Description: "Materials and Reliability Handbook for Semiconductor Optical and Electron Devices" provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in  More...
    Buy it from: $230.36
    Rent it from: $135.84
    This item will ship on Monday, December 29 .

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    Publisher: Springer London, Limited
    Binding: Hardcover
    Pages: 616
    Size: 6.25" wide x 9.25" long x 1.50" tall
    Weight: 2.200
    Language: English

    "Materials and Reliability Handbook for Semiconductor Optical and Electron Devices" provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature.The" Handbook "addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The "Handbook" emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.

    Osamu Ueda earned his Ph.D. in physical engineering from the University of Tokyo. Ueda is a senior researcher at Fujitsu Laboratories Ltd., Japan. Dr. Ueda has written more than 100 professional papers and is a member of the Society of Applied Physics, the Society of Electron Microscopy, the Electrochemical Society, and the Materials Research Society.

    Fan Ren works with the University of Florida, Gainesville.Stephen J. Pearton works with the University of Florida, Gainesville.

    Buy it from $230.36
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    • Due Date: 6/8/2015

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